Interfaces in organic devices studied with resonant soft x-ray reflectivity

Journal of Applied Physics

Volumn 110, Issue 10, 2011, Pages

  Yan, Hongping ^a   Wang, Cheng ^b   Garcia, Andres ^c   Swaraj, Sufal ^a,d   Gu, Ziran ^a   McNeill, Christopher R ^e   Schuettfort, Torben ^e   Sohn, Karen E ^f   Kramer, Edward J ^f   Bazan, Guillermo C ^c,f   Nguyen, Thuc Quyen ^c   Ade, Harald ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d SYNCHROTRON SOLEIL   (France)

^e UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^f University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; ACTIVE LAYER; BOTTOM LAYERS; CONVENTIONAL METHODS; DIFFERENT SOLVENTS; DONOR AND ACCEPTOR; ELEVATED TEMPERATURE; INTERFACIAL WIDTH; ORGANIC DEVICES; ORGANIC SOLAR CELL; ORGANIC THIN FILM TRANSISTORS; POLYMER LIGHT-EMITTING DIODES; PREANNEALING; SIMPLE METHOD; SOFT-X-RAY REFLECTIVITY;

CONJUGATED POLYMERS; DIELECTRIC MATERIALS; FLUORINE; LIGHT EMITTING DIODES; MULTILAYERS; REFLECTION; SEMICONDUCTING POLYMERS; THIN FILM TRANSISTORS;

INTERFACES (MATERIALS);

EID: 82555177278     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3661991     Document Type: Conference Paper

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