Characterization of multicomponent polymer trilayers with resonant soft x-ray reflectivity

Journal of Polymer Science, Part B: Polymer Physics

Volumn 47, Issue 13, 2009, Pages 1291-1299

  Ade, H ^a   Wang, C ^a,b   Garcia, A ^c   Yan, H ^a   Sohn, K E ^d   Hexemer, A ^b   Bazan, G C ^c,d   NguyenT Q , ^c   Kramer, E J ^d  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d University of California   (United States)

Author keywords

Interfaces; Organic devices; Resonance reflectivity; Thin films; X ray reflectivity

Indexed keywords

BI-LAYER; INORGANIC SUBSTRATES; INTERFACES; INTERFACIAL WIDTH; MULTICOMPONENT POLYMERS; ORGANIC DEVICES; ORGANIC ELECTRONICS; OTHER INTERFACES; PHOTON ENERGY; POLYMERIC LAYERS; REFERENCE BEAMS; SILICON SUBSTRATES; SOFT-X-RAY REFLECTIVITY; TRILAYERS; X RAY REFLECTION; X-RAY REFLECTIVITY;

FILM PREPARATION; MULTILAYERS; POLYMERS; REFLECTION; RESONANCE; X RAY DIFFRACTION; X RAYS;

SUBSTRATES;

EID: 68149170480     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.21730     Document Type: Article

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