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Volumn 18, Issue 4-6, 2012, Pages 151-158

Zirconocene Alkoxides, promising precursors for MOCVD of zirconium dioxide thin films

Author keywords

MOCVD; Nanohardness; Thin films; Zirconium oxide; Zirconocene alkoxides

Indexed keywords

AISI 316; ALKOXIDES; BERKOVICH HARDNESS; COATED SAMPLE; CRYSTALLOGRAPHIC STUDIES; ELASTIC RECOVERY; HIGH QUALITY; METAL-ORGANIC; NANOINDENTATION TESTS; SI(1 0 0); TERT BUTANOL; THERMOGRAVIMETRIC MEASUREMENT; TRIETHYLAMINES; ZIRCONIUM ALKOXIDES; ZIRCONIUM DIOXIDE THIN FILMS; ZIRCONOCENES;

EID: 84862135161     PISSN: 09481907     EISSN: 15213862     Source Type: Journal    
DOI: 10.1002/cvde.201106950     Document Type: Article
Times cited : (9)

References (57)
  • 51
    • 0004150157 scopus 로고    scopus 로고
    • Program for the Refinement of Crystal Structures, University of Göttingen, Germany
    • G. M. Sheldrick, "SHELXL-97", Program for the Refinement of Crystal Structures, University of Göttingen, Germany 1997.
    • (1997) SHELXL-97
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.