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Volumn 23, Issue 5, 2011, Pages 1113-1119

Stability study of a magnesium β-diketonate as precursor for chemical vapor deposition of MgO

Author keywords

Chemical Vapor Deposition; Precursor Routes to Materials; Structural Characterization

Indexed keywords

CHEMICAL COMPOSITIONS; CVD PROCESS; IN-SITU; IR AND NMR SPECTROSCOPY; LASER REFLECTANCES; MAGNESIUM OXIDES; POLYCRYSTALLINE; PRECURSOR ROUTES; PROCESSING CONDITION; SI(1 0 0); STABILITY STUDY; STRUCTURAL CHARACTERIZATION; SUBLIMATION RATES; TETRAMETHYL; TETRAMETHYLETHYLENEDIAMINE; THERMAL BEHAVIORS; THERMOGRAVIMETRIC MEASUREMENT; VAPOR PHASE;

EID: 79952162022     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm1020788     Document Type: Article
Times cited : (17)

References (67)
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    • Ph.D. Thesis; Institut National Polytechnique de Grenoble, Grenoble, France
    • Renault, O. Ph.D. Thesis; Institut National Polytechnique de Grenoble, Grenoble, France, 1998.
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    • 4 with Na(tmhd).
    • 4 with Na(tmhd).
  • 48
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    • 4 as a basic reagent.
    • 4 as a basic reagent.
  • 53
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    • 1H NMR measurements.
    • 1H NMR measurements.
  • 55
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    • The dissociation for complex 1 was observed throughout the investigated temperature range (100-225 °C).
    • The dissociation for complex 1 was observed throughout the investigated temperature range (100-225 °C).
  • 56
    • 79952127546 scopus 로고    scopus 로고
    • note
    • The LRI technique is based on the reflection of monochromatic radiation incident on the sample during the growth. The detected beam intensity results from the interference of rays reflected from different interfaces (air/film and film/substrate). Fringes are the result of subsequent constructive and destructive interferences, and their formation mainly depends on the different optical paths of the two beams, as well as on the material growth rate. Moreover, the distance between maxima of successive fringes allows a qualitative evaluation of the deposition rate constancy.
  • 60
    • 79952169116 scopus 로고    scopus 로고
    • NIST X-Ray Photoelectron Spectroscopy (XPS) Database, Version 3.5. (accessed Jan 2011).
    • NIST X-Ray Photoelectron Spectroscopy (XPS) Database, Version 3.5. http://srdata.nist.gov/xps/ (accessed Jan 2011).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.