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Volumn 27, Issue 4, 2012, Pages 16-24

Prognostics of thermal fatigue failure of solder joints in avionic equipment

Author keywords

[No Author keywords available]

Indexed keywords

FATIGUE CALCULATIONS; LEVEL OF DETAIL; PRACTICAL METHOD; REMAINING USEFUL LIVES; SAFETY-CRITICAL; SOLDER JOINTS; TEMPERATURE DATA; THERMAL FATIGUE FAILURES;

EID: 84861747658     PISSN: 08858985     EISSN: None     Source Type: Journal    
DOI: 10.1109/MAES.2012.6203714     Document Type: Article
Times cited : (4)

References (31)
  • 1
    • 38949147384 scopus 로고    scopus 로고
    • Effect of corrosion on the low cycle fatigue behavior of Sn-4.0Ag-0.5Cu lead-free solder joints
    • DOI 10.1016/j.ijfatigue.2007.06.009, PII S0142112307001879
    • C. Andersson andJ. Uu, Effect of corrosion on the low cycle fatigue behavior of Sn-4.0Ag-O.5Cu lead-free solder joints, Inti. Jnl. of Fatigue, Vol. 30, No. 5, May 2008, pp. 917-930. (Pubitemid 351232034)
    • (2008) International Journal of Fatigue , vol.30 , Issue.5 , pp. 917-930
    • Andersson, C.1    Liu, J.2
  • 2
    • 35348837204 scopus 로고    scopus 로고
    • Fatigue crack growth and life descriptions of Sn3.8Ag0.7Cu solder joints: A computational and experimental study
    • DOI 10.1109/ECTC.2007.373851, 4249937, Proceedings - 57th Electronic Components and Technology Conference 2007, ECTC '07
    • D. Bhate, D. Chan, G. Subbarayan and L. Nguyen, Fatigue crack growth and life descriptions of Sn3.8AgO.7Cu solder joints: A computational and experimental study, in Proc. 2007 Electronic Components and Technology Conference, 2007, pp. 558-565. (Pubitemid 47577084)
    • (2007) Proceedings - Electronic Components and Technology Conference , pp. 558-565
    • Bhate, D.1    Chan, D.2    Subbarayan, G.3    Nguyen, L.4
  • 3
    • 49349085642 scopus 로고    scopus 로고
    • Electronic prognostics-A case study using switched-mode power supplies (SMPS)
    • August
    • D. Brown, P. Kalgren and M. Roemer, Electronic prognostics-A case study using switched-mode power supplies (SMPS), IEEE Instrumentation & Measurement Magazine. Vol. 18, No. 4, August 2007, pp. 20-26.
    • (2007) IEEE Instrumentation & Measurement Magazine. , vol.18 , Issue.4 , pp. 20-26
    • Brown, D.1    Kalgren, P.2    Roemer, M.3
  • 6
    • 0031342784 scopus 로고    scopus 로고
    • Thermomechanical Response of Materials and Interfaces in Electronic Packaging: Part I -Unified Constitutive Model and Calibration
    • C.S. Desai, J. Chia, T. Kundu and J.L. Prince, Thennomechanical Response of Materials and Interfaces in Electronic Packaging: Part I-Unified Constitutive Model and Calibration, Trans. ASME Jnl. Electronic Packaging. Vol. 119, December 1997, pp. 294-300. (Pubitemid 127448554)
    • (1997) Journal of Electronic Packaging, Transactions of the ASME , vol.119 , Issue.4 , pp. 294-300
    • Desai, C.S.1    Chia, J.2    Kundu, T.3    Prince, J.L.4
  • 7
    • 0025550913 scopus 로고
    • The use environments of electronic assemblies and their impact on surface mount solder attachment reliability
    • DOI 10.1109/33.62538
    • W. Engelmaier, The Use Environments of Electronic Assemblies and Their Impact on Surface Mount Solder Attachment Reliability, IEEE Trans. Components. Hybrids. and Manufacturing Technology, Vol. 13, Issue 4, December 1990, pp. 903-908. (Pubitemid 21738115)
    • (1990) IEEE transactions on components, hybrids, and manufacturing technology , vol.13 , Issue.4 , pp. 903-908
    • Engelmaier Werner1
  • 12
    • 35348922235 scopus 로고    scopus 로고
    • Prognostics Health Monitoring (PHM) for prior-damage assessment in electronics equipment under thermo-mechanical loads
    • DOI 10.1109/ECTC.2007.373934, 4250020, Proceedings - 57th Electronic Components and Technology Conference 2007, ECTC '07
    • P. Lall, M. Hande, C. Bhat, J. Suhling and J. Lee, Prognostics health monitoring (PHM) for prior-damage assessment in electronics equipment under thermo-mechanical loads, in Proc. 2007 Electronic Components and Technology Conference. 2007, pp. 1097-111. (Pubitemid 47577167)
    • (2007) Proceedings - Electronic Components and Technology Conference , pp. 1097-1111
    • Lall, P.1    Hande, M.2    Bhat, C.3    Suhling, J.4    Lee, J.5
  • 13
    • 63049105034 scopus 로고    scopus 로고
    • Leading indicators of failure for prognostication of leaded and lead-free electronics in harsh environments
    • March
    • P. Lall, N. Islam, P. Choudhary and J.C. Suhting, Leading indicators of failure for prognostication of leaded and lead-free electronics in harsh environments, IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. I, 135-144, March 2009.
    • (2009) IEEE Transactions on Components and Packaging Technologies , vol.32 , Issue.1 , pp. 135-144
    • Lall, P.1    Islam, N.2    Choudhary, P.3    Suhting, J.C.4
  • 18
    • 33751520387 scopus 로고    scopus 로고
    • Prognostic health management for avionics system power supplies, in Proc. 2005
    • R. Orsagh, D. Brown, M. Roemer, T. Dabnev and A. Hess, Prognostic health management for avionics system power supplies, in Proc. 2005 IEEE Aerospace Conference, 2005, pp. 3585-3591.
    • (2005) IEEE Aerospace Conference , pp. 3585-3591
    • Orsagh, R.1    Brown, D.2    Roemer, M.3    Dabnev, T.4    Hess, A.5
  • 19
    • 67650524173 scopus 로고    scopus 로고
    • International conference on therma mechanical and multi-physics simulation and experiments in microelectronics and microsystems, EuroSime2009
    • April 26-29
    • N. Patil, D. Das, C. Yin, H. Lu, C. Bailey and M. Pecht, A Fusion Approach to I GBT Power Module Prognostics, 1 rI' International Conference on Therma Mechanical and Multi-Physics simulation and Experiments in Microelectronics and Microsystems, EuroSime2009, April 26-29, 2009.
    • (2009) A Fusion Approach to I GBT Power Module Prognostics
    • Patil, N.1    Das, D.2    Yin, C.3    Lu, H.4    Bailey, C.5    Pecht, M.6
  • 22
    • 0142227054 scopus 로고    scopus 로고
    • A life consumption monitoring methodology for electronic systems
    • 3, September
    • A. Ramakrishnan and M.G. Pecht, A life consumption monitoring methodology for electronic systems, 1EEE Trans. Components and Packaging TechnolOgies, Vol. 26, No.3, September 2003, pp. 625-634.
    • (2003) 1EEE Trans. Components and Packaging TechnolOgies , vol.26 , pp. 625-634
    • Ramakrishnan, A.1    Pecht, M.G.2
  • 25
    • 1142288422 scopus 로고    scopus 로고
    • GeneraIized multi-domain method for fatigue analysis of interconnect structures
    • M. Rassaian and J.C. Lee, GeneraIized Multi-Domain Method for Fatigue Analysis of Interconnect Structures, Finite Elements in Analysis and Design, Vol. 40, 2004, pp. 793-805.
    • (2004) Finite Elements in Analysis and Design , vol.40 , pp. 793-805
    • Rassaian, M.1    Lee, J.C.2
  • 27
    • 0038689228 scopus 로고    scopus 로고
    • Fatigue life models for SnAg Cu and SnPb solder joints evaluated by experiments and simulation
    • A. Schubert,R Dudek,E. A uerswald,A. GoIIhardt,B. M ichel and H. Reichl, Fatigue life models for SnAg Cu and SnPb solder joints evaluated by experiments and simulation, in Proc. 53rrl ECTC, 2003, pp. 603-610.
    • (2003) Proc. 53rrl ECTC , pp. 603-610
    • Schubert, A.1    Dudek, R.2    Auerswald, E.3    Goiihardt, A.4    Michel, B.5    Reichl, H.6
  • 30
    • 13444256234 scopus 로고    scopus 로고
    • In situ temperature measurement of a notebook computer - A case study in health and usage monitoring of electronics
    • DOI 10.1109/TDMR.2004.838403
    • N. Vichare, P. Rodgers, V. Eveloy and M.G. Pecht, In situ temperature measurement of a notebook computer-A case study in health and usage monitoring of electronics, IEEE Transactions on Device and Materials Reliability, Vol. 4, No.4, December 2004, pp. 658-663. (Pubitemid 40212317)
    • (2004) IEEE Transactions on Device and Materials Reliability , vol.4 , Issue.4 , pp. 658-663
    • Vichare, N.1    Rodgers, P.2    Eveloy, V.3    Pecht, M.G.4
  • 31
    • 34548716433 scopus 로고    scopus 로고
    • Methods for binning and density estimation of load parameters for prognostics and health management
    • Apri12006
    • N. Vichare, P. Rodgers and M. Pecht, Methods for Binning and Density Estimation of Load Parameters for Prognostics and Health Management, International Journal of Performability Engineering, Vol. 2, No.2, Apri12006, pp. 149-161.
    • International Journal of Performability Engineering , vol.2 , Issue.2 , pp. 149-161
    • Vichare, N.1    Rodgers, P.2    Pecht, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.