A fusion approach to IGBT power module prognostics

2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009

Volumn , Issue , 2009, Pages

  Patil, Nishad ^a   Das, Diganta ^a   Yin, Chunyan ^b   Lub, Hua ^a   Bailey, Chris ^b   Pecht, Michael ^a,c  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF GREENWICH   (United Kingdom)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL FAILURES; EFFECTS ANALYSIS; FAILURE MECHANISM; PARAMETER MONITORING; PHYSICS OF FAILURES; POWER MODULE; REMAINING USEFUL LIVES;

ACTIVE FILTERS; DURABILITY; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MECHANISMS; MICROELECTRONICS; MICROSYSTEMS; QUALITY ASSURANCE; SIMULATORS;

FAILURE ANALYSIS;

EID: 67650524173     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESIME.2009.4938491     Document Type: Conference Paper

References (10)

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