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Volumn , Issue , 2007, Pages 101-106

Prognostics implementation methods for electronics

Author keywords

Electronics; Failure mechanism; Failure mode; Prognostics; Reliability

Indexed keywords

ON-CHIP PACKAGING; PROGNOSTICS IMPLEMENTATION;

EID: 34547279468     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2007.328050     Document Type: Conference Paper
Times cited : (48)

References (21)
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  • 7
    • 33644805582 scopus 로고    scopus 로고
    • Framework for Prognostics of Electronic Systems
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    • Anderson, N. and Wilcoxon, R,; "Framework for Prognostics of Electronic Systems," Proceedings of the COTS Conference., Seattle, WA, Aug. 3-5, 2004.
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  • 10
    • 34047148986 scopus 로고    scopus 로고
    • Electronics Reliability Prognosis through Material Modeling and Simulation
    • Big Sky, MT
    • Nasser, L. and Curtin, M.; "Electronics Reliability Prognosis through Material Modeling and Simulation", IEEE Aerospace Conference, Big Sky, MT, 2006.
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    • Nasser, L.1    Curtin, M.2
  • 13
    • 84888685200 scopus 로고    scopus 로고
    • Prognostic Assessment of Aluminum Support Structure on a Printed Circuit Board, Accepted for publication in ASME
    • Mathew, S.; Das, D.; Osterman, M.; Pecht, M.G., and Ferebee, R.; "Prognostic Assessment of Aluminum Support Structure on a Printed Circuit Board," Accepted for publication in ASME Journal of Electronic Packaging.
    • Journal of Electronic Packaging
    • Mathew, S.1    Das, D.2    Osterman, M.3    Pecht, M.G.4    Ferebee, R.5
  • 14
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    • A Strategy for Enabling Data Driven Product Decisions through a Comprehensive Understanding of the Usage Environment
    • Kauai, Hawaii, USA, July 8-13
    • Searls, D.; Dishongh, T., and Dujari, P.; "A Strategy for Enabling Data Driven Product Decisions through a Comprehensive Understanding of the Usage Environment," Proceedings of IPACK'01 Conference, Kauai, Hawaii, USA, July 8-13, 2001. pp. 1279-1284.
    • (2001) Proceedings of IPACK'01 Conference , pp. 1279-1284
    • Searls, D.1    Dishongh, T.2    Dujari, P.3
  • 15
    • 13444256234 scopus 로고    scopus 로고
    • In - Situ Temperature Measurement of a Notebook Computer - A Case Study in Health and Usage Monitoring of Electronics
    • December
    • Vichare, N.; Rodgers, P.; Eveloy, V.; and Pecht, M.; "In - Situ Temperature Measurement of a Notebook Computer - A Case Study in Health and Usage Monitoring of Electronics," IEEE Transactions on Device and Materials Reliability, Vol. 4., No. 4, December 2004, pp. 658-663.
    • (2004) IEEE Transactions on Device and Materials Reliability , vol.4 , Issue.4 , pp. 658-663
    • Vichare, N.1    Rodgers, P.2    Eveloy, V.3    Pecht, M.4
  • 17
    • 33847767110 scopus 로고    scopus 로고
    • Electronic Prognostics -A Case Study Using Global Positioning System (GPS)
    • September
    • Brown, D.; Kalgren, P.; Byington, C.; and Orsagh, R.; "Electronic Prognostics -A Case Study Using Global Positioning System (GPS)," Proceedings of the IEEE Autotestcon, September 2005, pp. 832-838.
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  • 18
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    • Continuous System Telemetry Harness
    • Sun Labs Open House, viewed in August
    • Gross, K.; "Continuous System Telemetry Harness," Sun Labs Open House, 2004, research.sun.com/sunlabsday/docs.2004/talks/1.03_Gross.pdf, viewed in August 2005
    • (2004)
    • Gross, K.1
  • 19
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    • Environmental Life Cycle Information Management and Acquisition -First Experiences and Results from Field Trials
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    • Bodenhoefer, K.; "Environmental Life Cycle Information Management and Acquisition -First Experiences and Results from Field Trials," Proceedings of Electronics Goes Green 2004+, Berlin, September 5-8, 2004, pp. 541-546.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.