In-situ sensors for product reliability monitoring

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4755, Issue , 2002, Pages 10-19

  Mishra, Satchidananda ^a   Pecht, Michael ^a   Goodman, Douglas L ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b Ridgetop Group   (United States)

Author keywords

Built in test; Damage estimation; Failure prediction; Health monitoring; In situ sensor; Prognostic cells; Remaining life prediction

Indexed keywords

ALGORITHMS; BUILT-IN SELF TEST; COMPUTER SIMULATION; MICROPROCESSOR CHIPS; RELIABILITY THEORY; SENSORS; SHIFT REGISTERS;

RELIABILITY MONITORING;

SEMICONDUCTOR DEVICES;

EID: 0242494883     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.462807     Document Type: Article

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