Comparison of techniques for measuring carrier lifetime in thin-film and multicrystalline photovoltaic materials

Solar Energy Materials and Solar Cells

Volumn 94, Issue 12, 2010, Pages 2197-2204

  Ahrenkiel, R K ^a,b   Call, N ^a,b   Johnston, S W ^b   Metzger, W K ^b  

^a Department of Geology and Geological Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Photoconductive decay; Photoluminescence decay; Recombination lifetime; Space charge limited current; Trapping

Indexed keywords

PHOTOCONDUCTIVE DECAY; PHOTOLUMINESCENCE DECAY; RECOMBINATION LIFETIME; SPACE CHARGE LIMITED CURRENTS; TRAPPING;

CARRIER MOBILITY; DECAY (ORGANIC); EXCITED STATES; PHOTOCONDUCTIVITY; PHOTOEXCITATION; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

CARRIER LIFETIME;

EID: 77957661672     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.07.012     Document Type: Article

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