Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition

Journal of Physics D: Applied Physics

Volumn 45, Issue 22, 2012, Pages

  Novotny M ^a   Ciźek J ^b   Kuzel R ^b   Bulir J ^a   Lancok J ^a   Connolly, J ^c   McCarthy, E ^c   Krishnamurthy, S ^c   Mosnier, J P ^c   Anwand, W ^d   Brauer, G ^d  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

^c National Centre for Plasma Science and Technology (NCPST)   (Ireland)

^d INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CRYSTALLITE SIZE; DEFECTS; FUSED SILICA; II-VI SEMICONDUCTORS; METALLIC FILMS; PULSED LASER DEPOSITION; PULSED LASERS; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

DIFFERENT SUBSTRATES; FUSED SILICA SUBSTRATES; IN-PLANE STRESS; PULSED-LASER DEPOSITION; SINGLE CRYSTALLINE SUBSTRATES; SLOW POSITRON IMPLANTATION SPECTROSCOPIES; STRUCTURAL CHARACTERIZATION; VARIOUS SUBSTRATES; ZNO FILMS; ZNO THIN FILM;

MAGNESIA;

EID: 84861412711     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/45/22/225101     Document Type: Article

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