Ultraviolet detection with ultrathin ZnO epitaxial films treated with oxygen plasma

Applied Physics Letters

Volumn 84, Issue 2, 2004, Pages 173-175

  Liu, Mingjiao ^a   Kim, Hong Koo ^a  

^a University of Pittsburgh   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CHEMISORPTION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; EPITAXIAL GROWTH; MICROSTRUCTURE; OPTICAL PROPERTIES; PHOTOCURRENTS; PLASMAS; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

BAND BENDING; CRYSTALLINITY; OXYGEN VACANCIES; PHOTOCONDUCTOR STRUCTURE; PHOTOCURRENT TRANSIENTS; PLASMA TREATMENT; ULTRAVIOLET DETECTION;

ULTRATHIN FILMS;

EID: 0842333251     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1640468     Document Type: Article

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