ZnO nanostructured transparent thin films by PLD

Reviews on Advanced Materials Science

Volumn 10, Issue 4, 2005, Pages 331-334

  Christoulakis, S ^a,b   Suchea, Mira ^a,b   Katharakis, M ^c   Katsarakis, N ^a,c   Koudoumas, E ^c   Kiriakidis, G ^a,b  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b UNIVERSITY OF CRETE   (Greece)

^c TECHNOLOGICAL EDUCATIONAL INSTITUTE OF CRETE   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; EXCIMER LASERS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SURFACE TOPOGRAPHY; THIN FILMS; X RAY DIFFRACTION;

FILM SURFACE TOPOGRAPHY; POLYCRYSTALLINE WURTZITE; TRANSPARENT THIN FILMS;

ZINC OXIDE;

EID: 27744511056     PISSN: 16065131     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)

1. D. P. Norton, Y. W. Heo, M. P. Ivill, K. Ip, S. J. Pearton, M. F. Chisholm and T. Steiner // Materials Today 7 (2004) 34.
2. T. K. Subramanyam, B. S. A. Naidu and S. Uthanna // Cryst. Res. Trechnol. 35 (2000) 1193.
3. E. Vasco, C. Zaldo and L. Vázquez // J. Phys.: Condens. Matter 13 (2001) L663.
4. M. Suchea and G. Kiriakidis, In: IEEE CAS 2004 Proc. Int. Conf. (Sinaia, Romania, 4-6 October 2004) p. 345.
5. G. Kiriakidis, N. Katsarakis, M. Katharakis, M. Suchea, K. Galatsis, W. Wlodarski and D. Kotzias, In: IEEE CAS 2004 Proc. Int. Conf. (Sinaia, Romania, 4-6 October 2004) p. 325.
6. M. Suchea, M. Katharakis, S. Christoulakis, N. Katsarakis and G. Kiriakidis // IOP J. Physics: Conference Series MMN2004 International Conference, (Athens, 14-17 nov.2004), in press.
7. N. Barsan and U. Weimar // Journal of Electroceramics 7 (2001) 143.