High spatial resolution Kelvin probe force microscopy with coaxial probes

Nanotechnology

Volumn 23, Issue 11, 2012, Pages

  Brown, Keith A ^a   Satzinger, Kevin J ^b   Westervelt, Robert M ^a  

^a HARVARD UNIVERSITY   (United States)

^b TRUMAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM PROBE; COAXIAL PROBE; CONTACT POTENTIAL DIFFERENCE; ELECTROSTATIC FORCE MICROSCOPY; ELECTROSTATIC MODELS; HIGH SPATIAL RESOLUTION; KELVIN PROBE FORCE MICROSCOPY; LONG RANGE; SAMPLE SURFACE; SMALL REGION; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; ELECTRIC FORCE MICROSCOPY; ELECTROSTATIC FORCE; ELECTROSTATIC SEPARATORS; IMAGE RESOLUTION; NANOCANTILEVERS;

PROBES;

EID: 84857872825     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/23/11/115703     Document Type: Article

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