Self-driving capacitive cantilevers for high-frequency atomic force microscopy

Applied Physics Letters

Volumn 100, Issue 5, 2012, Pages

  Brown, Keith A ^a,b   Yang, Benjamin H ^a   Westervelt, R M ^a  

^a HARVARD UNIVERSITY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; CAPACITIVE CANTILEVERS; DRIVE VOLTAGE; DRIVING SYSTEMS; HIGH FREQUENCY; HIGH FREQUENCY HF; MECHANICAL RESONANCE; TAPPING MODES; THIN-FILM CAPACITORS; VIBRATION AMPLITUDE; VIBRATIONAL MODES;

ATOMIC FORCE MICROSCOPY; THIN FILM CIRCUITS; VIBRATIONS (MECHANICAL);

NANOCANTILEVERS;

EID: 84857016992     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3679684     Document Type: Article

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