Triaxial AFM probes for noncontact trapping and manipulation

Nano Letters

Volumn 11, Issue 8, 2011, Pages 3197-3201

  Brown, Keith A ^a   Westervelt, Robert M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

AFM; assembly; Dielectrophoresis; nanoparticles; noncontact trapping; triaxial

Indexed keywords

AFM; AFM PROBE; ELECTRIC FIELD PROFILES; FUNCTIONALIZED; NON-CONTACT; PROBE SURFACE; SELECTIVE IMAGING; SINGLE PARTICLE; THREE-DIMENSIONAL ASSEMBLY; TRIAXIAL;

ELECTRIC FIELDS; ELECTROPHORESIS; PROBES;

ATOMIC FORCE MICROSCOPY;

EID: 80051646592     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl201434t     Document Type: Article

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