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Applied Physics Letters

Volumn 98, Issue 18, 2011, Pages

Coaxial atomic force microscope probes for imaging with dielectrophoresis

(3) Brown, Keith A a Berezovsky, Jesse a,b Westervelt, R M a

a HARVARD UNIVERSITY (United States)

b CASE WESTERN RESERVE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; ANALYTIC FORMULA; APPLIED ELECTRIC FIELD; ATOMIC FORCE MICROSCOPES; COAXIAL PROBE; DIELECTRIC SPHERES; DIELECTRIC SUBSTRATES; DIELECTROPHORESIS; ELECTRIC DIPOLE; QUANTITATIVE AGREEMENT; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; DIELECTRIC MATERIALS; ELECTRIC FIELDS; ELECTROPHORESIS;

PROBES;

EID: 79957453666 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3585670 Document Type: Article

Times cited : (9)

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