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Volumn 22, Issue , 2012, Pages 1-6

Effects of current density on the formation and microstructure of Sn-9Zn, Sn-8Zn-3Bi and Sn-3Ag-0.5Cu solder joints

Author keywords

A. Intermetallics; B. Diffusion; B. Phase identification; D. Phase interfaces; F. Electron microscopy, scanning

Indexed keywords

ANODE SIDE; CU SUBSTRATE; F. ELECTRON MICROSCOPY , SCANNING; GROWTH OF INTERMETALLICS; LEAD-FREE SOLDER ALLOY; PHASE IDENTIFICATION; SN-8ZN-3BI; SOLDER JOINTS; TESTING CONDITIONS;

EID: 82055200133     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.intermet.2011.10.011     Document Type: Article
Times cited : (14)

References (48)
  • 2
    • 14544277886 scopus 로고    scopus 로고
    • In situ observation of the void formation-and-propagation mechanism in solder joints under current-stressing
    • DOI 10.1016/j.actamat.2005.01.014, PII S1359645405000303
    • Y.H. Li, Y.C. Hu, C.M. Tsai, C.R. Kao, and K.N. Tu In situ observation of the void formation and propagation mechanism in solder joints under current-stressing Acta Mater 53 2005 2029 2035 (Pubitemid 40302948)
    • (2005) Acta Materialia , vol.53 , Issue.7 , pp. 2029-2035
    • Lin, Y.H.1    Hu, Y.C.2    Tsai, C.M.3    Kao, C.R.4    Tu, K.N.5
  • 3
    • 33845725618 scopus 로고    scopus 로고
    • Electromigration effects on intermetallic growth at wire-bond interfaces
    • DOI 10.1007/s11664-006-0300-0
    • H.T. Orchard, and A.L. Greer Electromigration effects on intermetallic growth at wire-bond interfaces J Electron Mater 35 11 2006 1961 1968 (Pubitemid 46011426)
    • (2006) Journal of Electronic Materials , vol.35 , Issue.11 , pp. 1961-1968
    • Orchard, H.T.1    Greer, A.L.2
  • 4
    • 67649450466 scopus 로고    scopus 로고
    • Electromigration on void formation of Sn-3Ag-1.5Cu FCBGA solder joints
    • M.H.R. Jen, L.C. Liu, and Y.S. Lai Electromigration on void formation of Sn-3Ag-1.5Cu FCBGA solder joints Microelectron Reliab 49 2009 734 745
    • (2009) Microelectron Reliab , vol.49 , pp. 734-745
    • Jen, M.H.R.1    Liu, L.C.2    Lai, Y.S.3
  • 5
    • 81855194452 scopus 로고    scopus 로고
    • Effects of annealing and current stressing on the intermetallic compounds growth kinetics of Cu/thin Sn/Cu bump
    • in press
    • M.H. Jeong, J.W. Kim, B.H. Kwak, Y.B. Park, Effects of annealing and current stressing on the intermetallic compounds growth kinetics of Cu/thin Sn/Cu bump, Microelectron Eng in press.
    • Microelectron Eng
    • Jeong, M.H.1    Kim, J.W.2    Kwak, B.H.3    Park, Y.B.4
  • 6
    • 0037165887 scopus 로고    scopus 로고
    • Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures
    • C.M. Chen, and S.W. Chen Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures Acta Mater 50 2002 2461 2469
    • (2002) Acta Mater , vol.50 , pp. 2461-2469
    • Chen, C.M.1    Chen, S.W.2
  • 7
    • 84855466576 scopus 로고
    • Presented at 33rd IEEE Conference in electrical contacts Illinois Chicago
    • S.J. Krumbien Metallic electromigration phenomena Presented at 33rd IEEE Conference in electrical contacts September 21-23, 1987 Illinois Chicago
    • (1987) Metallic Electromigration Phenomena , vol.21
    • Krumbien, S.J.1
  • 8
    • 77955419734 scopus 로고    scopus 로고
    • Effect of electromigration on intermetallic compound formation in line-type Cu/Sn/Cu interconnect
    • L.D. Chen, M.L. Huang, and S.M. Zhou Effect of electromigration on intermetallic compound formation in line-type Cu/Sn/Cu interconnect J Alloys Compd 504 2010 535 541
    • (2010) J Alloys Compd , vol.504 , pp. 535-541
    • Chen, L.D.1    Huang, M.L.2    Zhou, S.M.3
  • 9
    • 74449092416 scopus 로고    scopus 로고
    • Electromigration behavior in Cu/Sn-8Zn-3Bi/Cu solder joint
    • L. Liu, W. Zhou, H. Zhang, B. Li, and P. Wu Electromigration behavior in Cu/Sn-8Zn-3Bi/Cu solder joint Microelectron Reliab 50 2010 251 257
    • (2010) Microelectron Reliab , vol.50 , pp. 251-257
    • Liu, L.1    Zhou, W.2    Zhang, H.3    Li, B.4    Wu, P.5
  • 10
    • 78349309806 scopus 로고    scopus 로고
    • Effects of current density and temperature on Sn/Ni interfacial reactions under current stressing
    • C.H. Wang, C. Kuo, H. Chen, and S. Chen Effects of current density and temperature on Sn/Ni interfacial reactions under current stressing Intermetallics 19 2011 75 80
    • (2011) Intermetallics , vol.19 , pp. 75-80
    • Wang, C.H.1    Kuo, C.2    Chen, H.3    Chen, S.4
  • 12
    • 63749107686 scopus 로고    scopus 로고
    • Polarity effect of electromigration on intermetallic compound formation in SnPb solder joints
    • Y.D. Lu, X.Q. He, Y.F. En, X. Wang, and Z.Q. Zhuang Polarity effect of electromigration on intermetallic compound formation in SnPb solder joints Acta Mater 57 2009 2560 2566
    • (2009) Acta Mater , vol.57 , pp. 2560-2566
    • Lu, Y.D.1    He, X.Q.2    En, Y.F.3    Wang, X.4    Zhuang, Z.Q.5
  • 13
    • 84855468505 scopus 로고    scopus 로고
    • Interfacial reactions between lead-free solders and Ni/Au surface finishes, Can
    • M.M. Mahat, D.N.A. Sha'ri, R. Junid, and J.A. Razak Interfacial reactions between lead-free solders and Ni/Au surface finishes, Can J Mech Sci Eng 2 3 2011 37 41
    • (2011) J Mech Sci Eng , vol.2 , Issue.3 , pp. 37-41
    • Mahat, M.M.1    Sha'Ri, D.N.A.2    Junid, R.3    Razak, J.A.4
  • 14
    • 28444454389 scopus 로고
    • Issues in the replacement of lead bearing solders
    • P.T. Vianco, and D.R. Frear Issues in the replacement of lead bearing solders JOM 45 7 1993 14 19
    • (1993) JOM , vol.45 , Issue.7 , pp. 14-19
    • Vianco, P.T.1    Frear, D.R.2
  • 15
    • 84855451050 scopus 로고    scopus 로고
    • Modeling Non-isothermal intermetallic layer growth in the 63Sn-37Pb system
    • R.K. Mahidhara, D.R. Frear, S.M.L. Sastry, K.L. Liaw, W.L. Winterbottom, TMS/AIME Warrendale, USA
    • P.T. Vianco, P.L. Hopkins, K.L. Erickson, D.R. Frear, and R. Davidson Modeling Non-isothermal intermetallic layer growth in the 63Sn-37Pb system R.K. Mahidhara, D.R. Frear, S.M.L. Sastry, K.L. Liaw, W.L. Winterbottom, The Minerals, metals and materials Society 1997 TMS/AIME Warrendale, USA
    • (1997) The Minerals, Metals and Materials Society
    • Vianco, P.T.1    Hopkins, P.L.2    Erickson, K.L.3    Frear, D.R.4    Davidson, R.5
  • 19
    • 34247104974 scopus 로고    scopus 로고
    • Effect of copper addition on the microstructure and mechanical properties of lead free solder alloy
    • DOI 10.1016/j.msea.2006.12.084, PII S0921509306027481
    • A. Kar, M. Ghosh, A.K. Ray, and R.N. Ghosh Effect of copper addition on the microstructure and mechanical properties of lead free solder alloy Mater Sci Eng A 459 2007 69 74 (Pubitemid 46586108)
    • (2007) Materials Science and Engineering A , vol.459 , Issue.1-2 , pp. 69-74
    • Kar, A.1    Ghosh, M.2    Ray, A.K.3    Ghosh, R.N.4
  • 20
    • 45449105560 scopus 로고    scopus 로고
    • Effects of multiple reflows on intermetallic morphology and shear strength of Sn-Ag-Cu-xNi composite solder joints on electrolytic Ni/Au metallized substrate
    • P. Yao, P. Liu, and J. Liu Effects of multiple reflows on intermetallic morphology and shear strength of Sn-Ag-Cu-xNi composite solder joints on electrolytic Ni/Au metallized substrate J Alloys Compd 462 2008 73 79
    • (2008) J Alloys Compd , vol.462 , pp. 73-79
    • Yao, P.1    Liu, P.2    Liu, J.3
  • 21
    • 0037076832 scopus 로고    scopus 로고
    • Six cases of reliability study of Pb-free solder joints in electronic packaging technology
    • K. Zeng, and K.N. Tu Six cases of reliability study of Pb-free solder joints in electronic packaging technology Mater Sci Eng R 38 2 2002 55 105
    • (2002) Mater Sci Eng R , vol.38 , Issue.2 , pp. 55-105
    • Zeng, K.1    Tu, K.N.2
  • 22
    • 20344388336 scopus 로고    scopus 로고
    • Interfacial reactions between lead-free solders and common base materials
    • DOI 10.1016/j.mser.2005.03.001, PII S0927796X05000513
    • T. Laurila, V. Vuorinen, and J.K. Kivilahti Interfacial reactions between lead-free solders and common base materials Mater Sci Eng R 49 1-2 2005 1 60 (Pubitemid 40788671)
    • (2005) Materials Science and Engineering R: Reports , vol.49 , Issue.1-2 , pp. 1-60
    • Laurila, T.1    Vuorinen, V.2    Kivilahti, J.K.3
  • 23
    • 0036575443 scopus 로고    scopus 로고
    • Intermetallic compounds formed during interfacial reactions between liquid Sn-8Zn-3Bi solders and Ni substrates
    • M.Y. Chiu, S.S. Wang, and T.H. Chuang Intermetallic compounds formed during interfacial reactions between liquid Sn-8Zn-3Bi solders and Ni substrates J Electron Mater 31 5 2002 494 499 (Pubitemid 34631350)
    • (2002) Journal of Electronic Materials , vol.31 , Issue.5 , pp. 494-499
    • Chiu, M.Y.1    Wang, S.S.2    Chuang, T.H.3
  • 24
    • 0942299490 scopus 로고    scopus 로고
    • Properties of quad flat package joints using Sn-Zn-Bi solder with varying lead-plating material
    • H. Iwanishi, A. Hirose, T. Imamura, K. Tateyama, I. Mori, and K.F. Kobayashi Properties of quad flat package joints using Sn-Zn-Bi solder with varying lead-plating material J Electron Mater 32 12 2003 1540 1546
    • (2003) J Electron Mater , vol.32 , Issue.12 , pp. 1540-1546
    • Iwanishi, H.1    Hirose, A.2    Imamura, T.3    Tateyama, K.4    Mori, I.5    Kobayashi, K.F.6
  • 25
    • 51249167662 scopus 로고
    • Improved mechanical properties in new Pb-free solder alloys
    • M.M. Cormack, and S. Jin Improved mechanical properties in new Pb-free solder alloys J Electron Mater 23 8 1994 715 720
    • (1994) J Electron Mater , vol.23 , Issue.8 , pp. 715-720
    • Cormack, M.M.1    Jin, S.2
  • 26
    • 48249139085 scopus 로고    scopus 로고
    • Wettability of Lead-free solders on gold-plated copper substrate
    • D.N. Binh, B.H. Luay, A.I. Badri, T. Ariga, and A.I. Badri wettability of Lead-free solders on gold-plated copper substrate Mater Trans JIM 49 6 2008 1462 1466
    • (2008) Mater Trans JIM , vol.49 , Issue.6 , pp. 1462-1466
    • Binh, D.N.1    Luay, B.H.2    Badri, A.I.3    Ariga, T.4    Badri, A.I.5
  • 27
    • 77349084832 scopus 로고    scopus 로고
    • 8 intermetallic in the Sn-Zn lead-free solder
    • 8 intermetallic in the Sn-Zn lead-free solder Intermetallics 18 2010 730 735
    • (2010) Intermetallics , vol.18 , pp. 730-735
    • Mayappan, R.1    Ahmad, Z.A.2
  • 31
    • 51249170304 scopus 로고
    • Intermettalic phase formation in thin solid-liquid diffusion couples
    • F. Bartels, J.W. Morris, G. Dalke, and W. Gust Intermettalic phase formation in thin solid-liquid diffusion couples J Electron Mater 23 8 1994 787 790
    • (1994) J Electron Mater , vol.23 , Issue.8 , pp. 787-790
    • Bartels, F.1    Morris, J.W.2    Dalke, G.3    Gust, W.4
  • 32
    • 60849105954 scopus 로고    scopus 로고
    • Kirkendall voids formation in the reaction between Ni-doped SnAg lead-free solders and different Cu substrates
    • Y.W. Wang, Y.W. Lin, and C.R. Kao Kirkendall voids formation in the reaction between Ni-doped SnAg lead-free solders and different Cu substrates Microelectron Reliab 49 2009 248 252
    • (2009) Microelectron Reliab , vol.49 , pp. 248-252
    • Wang, Y.W.1    Lin, Y.W.2    Kao, C.R.3
  • 33
    • 0000072496 scopus 로고    scopus 로고
    • Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening
    • H.K. Kim, and K.N. Tu Kinetic analysis of the soldering reaction between eutectic SnPb alloy and Cu accompanied by ripening Phys Rev B 53 1996 16027 16034
    • (1996) Phys Rev B , vol.53 , pp. 16027-16034
    • Kim, H.K.1    Tu, K.N.2
  • 34
    • 23844545543 scopus 로고    scopus 로고
    • Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder
    • DOI 10.1016/j.jallcom.2005.03.053, PII S0925838805002860
    • M.N. Islam, Y.C. Chana, M.J. Rizvi, and W. Jillek Investigations of interfacial reactions of Sn-Zn based and Sn-Ag-Cu lead-free solder alloys as replacement for Sn-Pb solder J Alloys Compd 400 2005 136 144 (Pubitemid 41165434)
    • (2005) Journal of Alloys and Compounds , vol.400 , Issue.1-2 , pp. 136-144
    • Islam, M.N.1    Chan, Y.C.2    Rizvi, M.J.3    Jillek, W.4
  • 35
    • 50149086959 scopus 로고    scopus 로고
    • 8 phase in the soldered Sn-Ag-Zn/Cu interface
    • 8 phase in the soldered Sn-Ag-Zn/Cu interface J Alloys Compd 465 2008 205 209
    • (2008) J Alloys Compd , vol.465 , pp. 205-209
    • Liu, Y.C.1    Wan, J.B.2    Gao, Z.M.3
  • 36
    • 0033885051 scopus 로고    scopus 로고
    • The adhesion strength of a lead-free solder hot-dipped on copper substrate
    • S.P. Yu, M.H. Hon, and M.C. Wang The adhesion strength of a lead-free solder hot-dipped on copper substrate J Electron Mater 29 2 2000 237 243
    • (2000) J Electron Mater , vol.29 , Issue.2 , pp. 237-243
    • Yu, S.P.1    Hon, M.H.2    Wang, M.C.3
  • 37
    • 25444439340 scopus 로고    scopus 로고
    • Role of Ag in the formation of interfacial intermetallic phases in Sn-Zn soldering
    • J.M. Song, P.C. Liu, C.L. Shih, and K.L. Lin Role of Ag in the formation of interfacial intermetallic phases in Sn-Zn soldering J Electron Mater 34 9 2005 1249 1254
    • (2005) J Electron Mater , vol.34 , Issue.9 , pp. 1249-1254
    • Song, J.M.1    Liu, P.C.2    Shih, C.L.3    Lin, K.L.4
  • 38
    • 33750483823 scopus 로고    scopus 로고
    • High temperature aging study of intermetallic compound formation of Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on electroless Ni(P) metallization
    • DOI 10.1016/j.jallcom.2006.01.080, PII S092583880600123X
    • P. Suna, C. Andersson, X. Wei, Z. Cheng, D. Shangguan, and J. Liu High temperature aging study of intermetallic compound formation of Sn-3.5Ag and Sn-4.0Ag-0.5Cu solders on electroless Ni(P) metallization J Alloys Compd 425 2006 191 199 (Pubitemid 44666375)
    • (2006) Journal of Alloys and Compounds , vol.425 , Issue.1-2 , pp. 191-199
    • Sun, P.1    Andersson, C.2    Wei, X.3    Cheng, Z.4    Shangguan, D.5    Liu, J.6
  • 39
    • 77954624365 scopus 로고    scopus 로고
    • Crystallographically faceted void formation in the matrix of lead-free solder joints
    • S. Belyakov, H.V. Atkinson, and S.P.A. Gill Crystallographically faceted void formation in the matrix of lead-free solder joints J Electron Mater 39 8 2010 1295 1297
    • (2010) J Electron Mater , vol.39 , Issue.8 , pp. 1295-1297
    • Belyakov, S.1    Atkinson, H.V.2    Gill, S.P.A.3
  • 40
    • 81855170098 scopus 로고    scopus 로고
    • Void formation at the interface in Sn/Cu solder joints
    • in press
    • Y. Yang, H. Lu, C. Yu, Y. Li, Void formation at the interface in Sn/Cu solder joints, Microelectron Reliab. in press.
    • Microelectron Reliab.
    • Yang, Y.1    Lu, H.2    Yu, C.3    Li, Y.4
  • 41
    • 0034293953 scopus 로고    scopus 로고
    • Electromigration effect upon the Zn/Ni and Bi/Ni interfacial reactions
    • C.M. Chen, and S.W. Chen Electromigration effect upon the Zn/Ni and Bi/Ni interfacial reactions J Electron Mater 29 10 2000 1222 1228
    • (2000) J Electron Mater , vol.29 , Issue.10 , pp. 1222-1228
    • Chen, C.M.1    Chen, S.W.2
  • 42
    • 33748289546 scopus 로고    scopus 로고
    • Electromigration effect on solder bump in Cu/Sn-3Ag-0.5Cu/Cu system
    • DOI 10.1016/j.scriptamat.2006.07.053, PII S1359646206005653
    • K. Yamanaka, Y. Tsukada, and K. Suganuma Electromigration effect on solder bump in Cu/Sn-3Ag-0.5Cu/Cu system Scr Mater 55 2006 867 870 (Pubitemid 44333027)
    • (2006) Scripta Materialia , vol.55 , Issue.10 , pp. 867-870
    • Yamanaka, K.1    Tsukada, Y.2    Suganuma, K.3
  • 43
    • 42449097152 scopus 로고    scopus 로고
    • Electromigration of Sn-9 wt.% Zn solder
    • Y.M. Hung, and C.M. Chen Electromigration of Sn-9 wt.% Zn solder J Electron Mater 37 6 2008 887 893
    • (2008) J Electron Mater , vol.37 , Issue.6 , pp. 887-893
    • Hung, Y.M.1    Chen, C.M.2
  • 44
    • 63649127166 scopus 로고    scopus 로고
    • Electromigration of Sn-8 wt.% Zn-3 wt.% Bi and Sn-9 wt.% Zn-1 wt.% Cu solders
    • C.M. Chen, Y.M. Hung, and C.H. Lin Electromigration of Sn-8 wt.% Zn-3 wt.% Bi and Sn-9 wt.% Zn-1 wt.% Cu solders J Alloys Compd 475 2009 238 244
    • (2009) J Alloys Compd , vol.475 , pp. 238-244
    • Chen, C.M.1    Hung, Y.M.2    Lin, C.H.3
  • 45
    • 42949111504 scopus 로고    scopus 로고
    • Electromigration of Pb-free solder under a low level of current density
    • DOI 10.1016/j.jallcom.2007.04.040, PII S092583880700847X
    • J.S. Zhang, Y.C. Chan, Y.P. Wu, H.J. Xi, and F.S. Wu Electromigration of Pb-free solder under a low level of current density J Alloys Compd 458 2008 492 499 (Pubitemid 351621057)
    • (2008) Journal of Alloys and Compounds , vol.458 , Issue.1-2 , pp. 492-499
    • Zhang, J.S.1    Chan, Y.C.2    Wu, Y.P.3    Xi, H.J.4    Wu, F.S.5
  • 46
    • 0041629447 scopus 로고    scopus 로고
    • Enhanced growth of intermetallic phases in the Ni-Ti system by current effects
    • J.E. Garay, U.A. Tamburini, and Z.A. Munir Enhanced growth of intermetallic phases in the Ni-Ti system by current effects Acta Mater 51 2003 4487 4495
    • (2003) Acta Mater , vol.51 , pp. 4487-4495
    • Garay, J.E.1    Tamburini, U.A.2    Munir, Z.A.3
  • 47
    • 0029223405 scopus 로고
    • Rapid formation of intermetallic compounds by interdiffusion in the Cu-Sn and Ni-Sn system
    • S. Bader, W. Gust, and H. Hieber Rapid formation of intermetallic compounds by interdiffusion in the Cu-Sn and Ni-Sn system Acta Mater 43 1995 329 337
    • (1995) Acta Mater , vol.43 , pp. 329-337
    • Bader, S.1    Gust, W.2    Hieber, H.3
  • 48
    • 0041154484 scopus 로고    scopus 로고
    • Reactions of solid copper with pure liquid tin and liquid tin saturated with copper
    • PII S1359646297001292
    • A. Hayashi, C.R. Kao, and Y.A. Chang Reactions of solid copper with pure liquid tin and liquid tin saturated with copper Scr Metall 37 4 1997 393 398 (Pubitemid 127379788)
    • (1997) Scripta Materialia , vol.37 , Issue.4 , pp. 393-398
    • Hayashi, A.1    Kao, C.R.2    Chang, Y.A.3


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