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Volumn 50, Issue 9, 2002, Pages 2461-2469
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Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures
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Author keywords
Electromigration
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Indexed keywords
ANNEALING;
CRYSTAL GROWTH;
ELECTRIC CURRENTS;
ELECTROMIGRATION;
HIGH TEMPERATURE EFFECTS;
INTERFACES (MATERIALS);
PHASE TRANSITIONS;
SURFACE REACTIONS;
THERMAL EFFECTS;
TIN;
INTERFACIAL REACTIONS;
SURFACE CHEMISTRY;
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EID: 0037165887
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(02)00076-9 Document Type: Conference Paper |
Times cited : (134)
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References (32)
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