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Volumn 50, Issue 9, 2002, Pages 2461-2469

Electromigration effect upon the Sn/Ag and Sn/Ni interfacial reactions at various temperatures

Author keywords

Electromigration

Indexed keywords

ANNEALING; CRYSTAL GROWTH; ELECTRIC CURRENTS; ELECTROMIGRATION; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); PHASE TRANSITIONS; SURFACE REACTIONS; THERMAL EFFECTS; TIN;

EID: 0037165887     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(02)00076-9     Document Type: Conference Paper
Times cited : (134)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.