-
1
-
-
0003694163
-
-
Computer Science Press, New York
-
ABRAMOVICI, M., BREUER, M. A., AND FRIEDMAN, A. D. 1990. Digital Systems Testing and Testable Design. Computer Science Press, New York.
-
(1990)
Digital Systems Testing and Testable Design
-
-
Abramovici, M.1
Breuer, M.A.2
Friedman, A.D.3
-
4
-
-
77953587427
-
Race analysis for systemc using model checking
-
BLANC, N. AND KROENING, D. 2010. Race analysis for systemc using model checking. ACM Trans. Des. Autom, Electron. Syst. 15, 3, 1-32.
-
(2010)
ACM Trans. Des. Autom, Electron. Syst.
, vol.15
, Issue.3
, pp. 1-32
-
-
Blanc, N.1
Kroening, D.2
-
5
-
-
49749123446
-
A mutation model for the SystemC TLM2.0 communication interfaces
-
ACM, New York
-
BOMBIERI, N., FUMMI, F., AND PRAVADELLI, G. 2008. A mutation model for the SystemC TLM2.0 communication interfaces. In Proceedings of the Conference on Design Automation and Test in Europe (DATE). ACM, New York, 396-401.
-
(2008)
Proceedings of the Conference on Design Automation and Test in Europe (DATE)
, pp. 396-401
-
-
Bombieri, N.1
Fummi, F.2
Pravadelli, G.3
-
6
-
-
70350048952
-
Functional qualification of TLM verification
-
ACM, New York
-
BOMBIERI, N., FUMMI, F., PRAVADELLI, G., HAMPTON, M., AND LETOMBE, F. 2009. Functional qualification of TLM verification. In Proceedings of the Conference on Design Automation and Test in Europe (DATE). ACM, New York, 190-195.
-
(2009)
Proceedings of the Conference on Design Automation and Test in Europe (DATE)
, pp. 190-195
-
-
Bombieri, N.1
Fummi, F.2
Pravadelli, G.3
Hampton, M.4
Letombe, F.5
-
7
-
-
48749128424
-
Mutation operators for Concurrent Java (J2SE 5.0)
-
BRADBURY, J., CORDY, J., AND DINGEL, J. 2006. Mutation operators for Concurrent Java (J2SE 5.0). In Workshop on Mutation Analysis, 2006. 11.
-
(2006)
Workshop on Mutation Analysis
, vol.2006
, pp. 11
-
-
Bradbury, J.1
Cordy, J.2
Dingel, J.3
-
8
-
-
0003108918
-
Mutation analysis: Ideas, examples, problems and prospects
-
North-Holland, Amsterdam
-
BUDD, T. A. 1981. Mutation analysis: Ideas, examples, problems and prospects. In Computer Program Testing, North-Holland, Amsterdam, 129-148.
-
(1981)
Computer Program Testing
, pp. 129-148
-
-
Budd, T.A.1
-
9
-
-
22644449714
-
High-level design verification of microprocessors via error modeling
-
CAMPENHOUT, D. V.,AL-ASAAD, H.,HAYES, J. P.,MUDGE, T., AND BROWN, R. B. 1998. High-level design verification of microprocessors via error modeling. ACM Trans. Des. Autom. Electron. Syst, 3, 4, 581-599. (Pubitemid 128733371)
-
(1998)
ACM Transactions on Design Automation of Electronic Systems
, vol.3
, Issue.4
, pp. 581-599
-
-
Van Campenhout, D.1
Al-Asaad, H.2
Hayes, J.P.3
Mudge, T.4
Brown, R.B.5
-
10
-
-
80155204085
-
-
CERTITUDE. 2010. Springsoft, Certitude website. http://www.springsoft. com/.
-
Certitude
, vol.2010
-
-
-
11
-
-
34548316927
-
Implementation of a transaction level assertion framework in SystemC
-
ACM, New York
-
ECKER, W., ESEN, V., STEININGER, T., VELTEN, M., AND HULL, M. 2007. Implementation of a transaction level assertion framework in SystemC. In Proceedings of the Conference on Design Automation and Test in Europe (DATE). ACM, New York, 1-6.
-
(2007)
Proceedings of the Conference on Design Automation and Test in Europe (DATE)
, pp. 1-6
-
-
Ecker, W.1
Esen, V.2
Steininger, T.3
Velten, M.4
Hull, M.5
-
12
-
-
0031638166
-
OCCOM: Efficient computation of observability-based code coverage metrics for functional verification
-
ACM, New York
-
FALLAH, F., DEVADAS, S., AND KEUTZER, K. 1998. OCCOM: Efficient computation of observability-based code coverage metrics for functional verification. In Proceedings of the Design Automation Conference (DAC). ACM, New York,152-157.
-
(1998)
Proceedings of the Design Automation Conference (DAC)
, pp. 152-157
-
-
Fallah, F.1
Devadas, S.2
Keutzer, K.3
-
14
-
-
2342498289
-
-
2nd Ed. Springer, Berlin
-
FOSTER, H. D., KROLNIK, A. C., AND LACEY, D. J. 2004. Assertion-Based Design 2nd Ed., Springer, Berlin.
-
(2004)
Assertion-Based Design
-
-
Foster, H.D.1
Krolnik, A.C.2
Lacey, D.J.3
-
15
-
-
0031235549
-
All-uses vs mutation testing: An experimental comparison of effectiveness
-
PII S0164121296001549
-
FRANKL, P. G., WEISS, S. N., AND HU, C. 1997. All-uses vs mutation testing: An experimental comparison of effectiveness. J. Syst. Softw. 38, 3, 235-253. (Pubitemid 127384432)
-
(1997)
Journal of Systems and Software
, vol.38
, Issue.3
, pp. 235-253
-
-
Frankl, P.G.1
Weiss, S.N.2
Hu, C.3
-
22
-
-
72249106863
-
Full simulation coverage for SystemC transaction-level models of systems-on- A-chip
-
HELMSTETTER, C., MARANINCHI, F., AND MAILLET-CONTOZ, L. 2009. Full simulation coverage for SystemC transaction-level models of systems-on-a-chip. Formal Methods Syst, Des. 35, 2, 152-189.
-
(2009)
Formal Methods Syst, Des.
, vol.35
, Issue.2
, pp. 152-189
-
-
Helmstetter, C.1
Maraninchi, F.2
Maillet-Contoz, L.3
-
23
-
-
34547482005
-
Automatic generation of schedulings for improving the test coverage of systems-on-a-chip
-
DOI 10.1109/FMCAD.2006.10, 4021023, Proceedings of Formal Methods in Computer Aided Design, FMCAD 2006
-
HELMSTETTER, C.,MARANINCHI, F.,MAILLET-CONTOZ, L., AND MOY, M. 2006. Automatic generation of schedulings for improving the test coverage of systems-on-a-chip. In Proceedings of the International Conference on Formal Methods in Computer-Aided Design (FMCAD). 171-178. (Pubitemid 47159938)
-
(2006)
Proceedings of Formal Methods in Computer Aided Design, FMCAD 2006
, pp. 171-178
-
-
Helmstetter, C.1
Maraninchi, F.2
Maillet-Contoz, L.3
Moy, M.4
-
25
-
-
23044521657
-
Dynamic state traversal for sequential circuit test generation
-
HSIAO, M. S., RUDNICK, E. M., AND PATEL, J. H. 2000. Dynamic state traversal for sequential circuit test generation. ACM Trans. Des. Autom. Electron. Syst. 5, 3, 548-565.
-
(2000)
ACM Trans. Des. Autom. Electron. Syst.
, vol.5
, Issue.3
, pp. 548-565
-
-
Hsiao, M.S.1
Rudnick, E.M.2
Patel, J.H.3
-
26
-
-
34547277473
-
Verification methodologies in a TLM-to-RTL design flow
-
DOI 10.1109/DAC.2007.375152, 4261171, 2007 44th ACM/IEEE Design Automation Conference, DAC'07
-
KASUYA, A. AND TESFAYE, T. 2007. Verification methodologies in a TLM-to-RTL design flow. In Proceedings of the Design Automation Conference (DAC). 199-204. (Pubitemid 47129953)
-
(2007)
Proceedings - Design Automation Conference
, pp. 199-204
-
-
Kasuya, A.1
Tesfaye, T.2
-
28
-
-
58049158331
-
A theory ofmutations with applications to vacuity, coverage, and fault tolerance
-
KUPFERMAN, O.,LI,W., AND SESHIA, S. A. 2008. A theory ofmutations with applications to vacuity, coverage, and fault tolerance. In Proceedings of the International Conference on Formal Methods in Computer-Aided Design (FMCAD). 1-9.
-
(2008)
Proceedings of the International Conference on Formal Methods in Computer-Aided Design (FMCAD)
, pp. 1-9
-
-
Kupferman, O.1
Li, W.2
Seshia, S.A.3
-
29
-
-
0017996760
-
Time, clocks, and the ordering of events in a distributed system
-
DOI 10.1145/359545.359563
-
LAMPORT, L. 1978. Time, clocks, and the ordering of events in a distributed system. Comm. ACM 21, 7, 558-565. (Pubitemid 8615486)
-
(1978)
Communications of the ACM
, vol.21
, Issue.7
, pp. 558-565
-
-
Lamport, L.1
-
30
-
-
69949099871
-
An experimental comparison of four unit test criteria: Mutation, edge-pair, all-uses and prime path coverage
-
IEEE, Los Alamitos, CA
-
LI, N., PRAPHAMONTRIPONG, U., AND OFFUTT, J. 2009. An experimental comparison of four unit test criteria: Mutation, edge-pair, all-uses and prime path coverage. In Proceedings of the IEEE International Conference on Software Testing Verification and Validation Workshop. IEEE, Los Alamitos, CA, 220-229.
-
(2009)
Proceedings of the IEEE International Conference on Software Testing Verification and Validation Workshop
, pp. 220-229
-
-
Li, N.1
Praphamontripong, U.2
Offutt, J.3
-
31
-
-
20844460416
-
MuJava: An automated class mutation system
-
DOI 10.1002/stvr.308
-
MA, Y.-S., OFFUTT, J., AND KWON, Y. R. 2005. MuJava: An automated class mutation system: Research articles. Softw. Test. Verification Reliability 15, 2, 97-133. (Pubitemid 40858060)
-
(2005)
Software Testing Verification and Reliability
, vol.15
, Issue.2
, pp. 97-133
-
-
Ma, Y.-S.1
Offutt, J.2
Kwon, Y.R.3
-
36
-
-
0028728758
-
Mutation analysis testing for finite state machines
-
PINTO FERRAZ FABBRI, S. C., DELAMARO, M., MALDONADO, J., AND MASIERO, P. 1994. Mutation analysis testing for finite state machines. In Proceedings of the 5th International Symposium on Software Reliability Engineering. 220-229.
-
(1994)
Proceedings of the 5th International Symposium on Software Reliability Engineering
, pp. 220-229
-
-
Pinto Ferraz Fabbri, S.C.1
Delamaro, M.2
Maldonado, J.3
Masiero, P.4
-
37
-
-
51349126023
-
A tractable and fast method for monitoring SystemC TLM specifications
-
PIERRE, L. AND FERRO, L. 2008. A tractable and fast method for monitoring SystemC TLM specifications. IEEE Trans. Computers 57, 10, 1346-1356.
-
(2008)
IEEE Trans. Computers
, vol.57
, Issue.10
, pp. 1346-1356
-
-
Pierre, L.1
Ferro, L.2
-
39
-
-
34047193962
-
Formal verification of simulation traces using computation slicing
-
DOI 10.1109/TC.2007.1011
-
SEN, A. AND GARG, V. K. 2007. Formal verification of simulation traces using computation slicing. IEEE Trans. Computers 56, 4, 511-527. (Pubitemid 46540231)
-
(2007)
IEEE Transactions on Computers
, vol.56
, Issue.4
, pp. 511-527
-
-
Sen, A.1
Garg, V.K.2
-
42
-
-
58049147791
-
A temporal language for SystemC
-
TABAKOV, D.,VARDI,M. Y.,KAMHI, G., AND SINGERMAN, E. 2008. A temporal language for SystemC. In Proceedings of the International Conference on Formal Methods in Computer-Aided Design (FMCAD). 1-9.
-
(2008)
Proceedings of the International Conference on Formal Methods in Computer-Aided Design (FMCAD)
, pp. 1-9
-
-
Tabakov, D.1
Vardi, M.Y.2
Kamhi, G.3
Singerman, E.4
-
43
-
-
0035392814
-
Coverage metrics for functional validation of hardware designs
-
DOI 10.1109/54.936247
-
TASIRAN, S. AND KEUTZER, K. 2001. Coverage metrics for functional validation of hardware designs. IEEE Des. Test Comput. 18, 4, 36-45. (Pubitemid 32680584)
-
(2001)
IEEE Design and Test of Computers
, vol.18
, Issue.4
, pp. 36-45
-
-
Tasiran, S.1
Keutzer, K.2
-
44
-
-
77954565055
-
Defining and providing coverage for assertion-based dynamic verification
-
TONG, J. G., BOULE, M., AND ZILIC, Z. 2010. Defining and providing coverage for assertion-based dynamic verification. J. Electron. Testing 26, 2, 211-225.
-
(2010)
J. Electron. Testing
, vol.26
, Issue.2
, pp. 211-225
-
-
Tong, J.G.1
Boule, M.2
Zilic, Z.3
-
45
-
-
34547349041
-
Formal techniques for SystemC verification: Position Paper
-
DOI 10.1109/DAC.2007.375150, 4261169, 2007 44th ACM/IEEE Design Automation Conference, DAC'07
-
VARDI, M. Y. 2007. Formal techniques for SystemC verification; position paper. In Proceedings of the Design Automation Conference (DAC). 188-192. (Pubitemid 47129951)
-
(2007)
Proceedings - Design Automation Conference
, pp. 188-192
-
-
Vardi, M.Y.1
-
47
-
-
0020157396
-
Programmers use slices when debugging
-
DOI 10.1145/358557.358577
-
WEISER, M. 1982. Programmers use slices when debugging. Comm. ACM 25, 7, 446-452. (Pubitemid 12550162)
-
(1982)
Communications of the ACM
, vol.25
, Issue.7
, pp. 446-452
-
-
Weiser, M.1
|