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Volumn , Issue , 2007, Pages 203-209
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Leveraging a commercial mutation analysis tool for research
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Author keywords
[No Author keywords available]
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Indexed keywords
COMMERCIAL SOFTWARES;
EXTENSION MECHANISMS;
MICROELECTRONICS INDUSTRY;
MUTATION ANALYSIS;
COMPUTER SOFTWARE;
MICROELECTRONICS;
STANDARDS;
INDUSTRIAL RESEARCH;
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EID: 48049091818
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/TAICPART.2007.4344125 Document Type: Conference Paper |
Times cited : (32)
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References (7)
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