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Volumn , Issue , 2003, Pages
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Concurrent bug patterns and how to test them
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Author keywords
[No Author keywords available]
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Indexed keywords
DISTRIBUTED PARAMETER NETWORKS;
BUG FINDING;
CONCURRENT DESIGN;
FORMAL EXPERIMENTS;
INDUSTRIAL EXPERIENCE;
TIMING HEURISTICS;
TAXONOMIES;
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EID: 84947250078
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IPDPS.2003.1213511 Document Type: Conference Paper |
Times cited : (181)
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References (11)
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