A theory of mutations with applications to vacuity, coverage, and fault tolerance

Proceedings of the 2008 International Conference on Formal Methods in Computer-Aided Design, FMCAD

Volumn , Issue , 2008, Pages

  Kupferman, Orna ^a   Li, Wenchao ^b   Seshia, Sanjit A ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT IMPLEMENTATIONS; FAULT INJECTIONS; FAULT TOLERANT CIRCUITS; FORMAL APPROACHES; FORMAL SPECIFICATIONS;

COMPUTER AIDED DESIGN; FAULT TOLERANCE; NETWORKS (CIRCUITS); QUALITY ASSURANCE; RELIABILITY; SPECIFICATIONS;

FORMAL METHODS;

EID: 58049158331     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FMCAD.2008.ECP.29     Document Type: Conference Paper

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