Comparative study of hydrothermal treatment and thermal annealing effects on the properties of electrodeposited micro-columnar ZnO thin films

Thin Solid Films

Volumn 519, Issue 22, 2011, Pages 7738-7749

  Lupan, O ^a,b   Pauporte T ^a   Tiginyanu, I M ^c   Ursaki, V V ^c   Sontea V ^b   Ono, L K ^d   Cuenya, B Roldan ^d   Chow, L ^d  

^a PSL RESEARCH UNIVERSITY   (France)

^b TECHNICAL UNIVERSITY OF MOLDOVA   (Moldova)

^c INSTITUTE OF APPLIED PHYSICS   (Moldova)

^d UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

Electrodeposition; Hydrothermal treatment; Photoluminescence; Raman spectroscopy; Thermal annealing; Thin films; X ray photoelectron spectroscopy; Zinc oxide

Indexed keywords

AIR AMBIENT; AQUEOUS ENVIRONMENT; COMPARATIVE STUDIES; ELECTROCHEMICAL DEPOSITION; FILM QUALITY; FILM SURFACES; FLEXIBLE SUPPORTS; HIGH TEMPERATURE ANNEALING TREATMENTS; HIGHER TEMPERATURES; HYDROTHERMAL TREATMENT; HYDROTHERMAL TREATMENTS; HYDROTHERMALLY TREATED; LOW TEMPERATURES; PHOTOLUMINESCENCE PEAK; SAMPLE TREATMENT; STRUCTURAL AND OPTICAL PROPERTIES; TEMPERATURE RANGE; THERMAL ANNEALING EFFECTS; THERMAL-ANNEALING; ZNO; ZNO FILMS; ZNO THIN FILM;

ANNEALING; CHLORINE; DEPOSITION; ELECTROCHEMICAL PROPERTIES; ELECTROCHEMICAL SENSORS; ELECTRODEPOSITION; METALLIC FILMS; OPTOELECTRONIC DEVICES; PHOTOELECTRON SPECTROSCOPY; PHOTOLUMINESCENCE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REDUCTION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; VAPOR DEPOSITION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

OPTICAL PROPERTIES;

EID: 80052112664     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.05.072     Document Type: Article

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