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Volumn 517, Issue 23, 2009, Pages 6409-6413

Deposition and characterization of PEDOT/ZnO layers onto PET substrates

Author keywords

Atomic force microscopy; Magnetron sputtering; Optical parameters; PEDOT:PSS; Spectroscopic ellipsometry; X ray diffraction; ZnO

Indexed keywords

3 ,4-ETHYLENEDIOXYTHIOPHENE; CRITICAL THICKNESS; CRYSTALLINITIES; DEPOSITED FILMS; DIRECT-CURRENT MAGNETRON SPUTTERING; ENERGY RANGES; OPTICAL PARAMETERS; PEDOT:PSS; PET SUBSTRATE; POLYETHYLENETEREPHTHALATE; POLYSTYRENE SULFONATE; TRANSITION ENERGY; ZNO; ZNO FILMS; ZNO THIN FILM;

EID: 68349154731     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.02.100     Document Type: Article
Times cited : (20)

References (24)
  • 10
    • 68349138360 scopus 로고
    • US Patent No. 05403467
    • F. Jonas, G.-D. Wolf, US Patent No. 05403467, 1995.
    • (1995)
    • Jonas, F.1    Wolf, G.-D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.