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Volumn 517, Issue 23, 2009, Pages 6409-6413
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Deposition and characterization of PEDOT/ZnO layers onto PET substrates
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Author keywords
Atomic force microscopy; Magnetron sputtering; Optical parameters; PEDOT:PSS; Spectroscopic ellipsometry; X ray diffraction; ZnO
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Indexed keywords
3 ,4-ETHYLENEDIOXYTHIOPHENE;
CRITICAL THICKNESS;
CRYSTALLINITIES;
DEPOSITED FILMS;
DIRECT-CURRENT MAGNETRON SPUTTERING;
ENERGY RANGES;
OPTICAL PARAMETERS;
PEDOT:PSS;
PET SUBSTRATE;
POLYETHYLENETEREPHTHALATE;
POLYSTYRENE SULFONATE;
TRANSITION ENERGY;
ZNO;
ZNO FILMS;
ZNO THIN FILM;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
ATOMS;
DIFFRACTION;
ETHYLENE;
LIGHT TRANSMISSION;
MAGNETRONS;
METALLIC FILMS;
OPTICAL MICROSCOPY;
OPTICAL VARIABLES CONTROL;
ORGANIC POLYMERS;
POLYETHYLENE TEREPHTHALATES;
POLYSTYRENES;
SEMICONDUCTING ZINC COMPOUNDS;
SPECTROSCOPIC ELLIPSOMETRY;
SURFACE ROUGHNESS;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ZINC OXIDE;
OPTICAL PROPERTIES;
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EID: 68349154731
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2009.02.100 Document Type: Article |
Times cited : (20)
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References (24)
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