SCOPUS 정보 검색 플랫폼

Volumn 63, Issue 7, 2011, Pages 61-70

X-ray line profile analysis-An ideal tool to quantify structural parameters of nanomaterials

(6) Kerber, Michael B a Zehetbauer, Michael J a Schafler, Erhard a Spieckermann, Florian C a Bernstorff, Sigrid b Ungar, Tamas c

a UNIVERSITY OF VIENNA (Austria)

b SINCROTRONE TRIESTE (Italy)

c EÖTVÖS LORÁND UNIVERSITY (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITE SIZE; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; MOLECULAR CRYSTALS; NANOSTRUCTURED MATERIALS; PLASTIC DEFORMATION; X RAYS;

COHERENT DOMAIN SIZE; CRYSTALLINE REGIONS; DIFFRACTION THEORY; ENHANCED DETECTORS; MODERN TECHNOLOGIES; NANOSTRUCTURED METALS; STRUCTURAL PARAMETER; X-RAY LINE PROFILE ANALYSIS;

X RAY DETECTORS;

EID: 80051527747 PISSN: 10474838 EISSN: 15431851 Source Type: Journal
DOI: 10.1007/s11837-011-0115-1 Document Type: Article

Times cited : (48)

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