Line profile analysis: Pattern modelling versus profile fitting

Journal of Applied Crystallography

Volumn 39, Issue 1, 2006, Pages 24-31

  Scardi, Paolo ^a   Leoni, Matteo ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645149410     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889805032978     Document Type: Review

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