Stacking faults and twin boundaries in fcc crystals determined by x-ray diffraction profile analysis

Journal of Applied Physics

Volumn 100, Issue 2, 2006, Pages

  Balogh, Levante ^a   Ribárik, Gábor ^a   Ungár, Tamás ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; CRYSTAL STRUCTURE; DATA ACQUISITION; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; X RAY DIFFRACTION ANALYSIS;

CRYSTALLITE SIZE DISTRIBUTIONS; DIFFAX SOFTWARE; X-RAY DIFFRACTION PROFILE ANALYSIS;

STACKING FAULTS;

EID: 33746896245     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2216195     Document Type: Article

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