Crystallite size distribution and dislocation structure determined by diffraction profile analysis: Principles and practical application to cubic and hexagonal crystals

Journal of Applied Crystallography

Volumn 34, Issue 3, 2001, Pages 298-310

  Ungar T ^a   Gubicza, J ^a   Ribarik G ^a   Borbely A ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; SILICON NITRIDE;

ANISOTROPY; ARTICLE; CRYSTALLOGRAPHY; FOURIER ANALYSIS; PARTICLE SIZE; PLASTICITY; POWDER; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0034993318     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801003715     Document Type: Article

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