Scanning X-ray diffraction peak profile analysis in deformed Cu-polycrystals by synchrotron radiation

Acta Materialia

Volumn 47, Issue 3, 1999, Pages 1053-1061

  Zehetbauer, M ^a   Ungar T ^b   Kral, R ^a   Borbely A ^b   Schafler, E ^a   Ortner, B ^c   Amenitsch, H ^d   Bernstorff, S ^e  

^a UNIVERSITY OF VIENNA   (Austria)

^b EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^c Erich Schmid Institute of Materials Science   (Austria)

^d ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^e SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COLD ROLLING; DEFORMATION; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; METALLOGRAPHIC MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; POLYCRYSTALS; RESIDUAL STRESSES; STRESS ANALYSIS; SYNCHROTRON RADIATION; X RAY CRYSTALLOGRAPHY;

X RAY PEAK PROFILE ANALYSIS;

COPPER;

EID: 0033524611     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00366-8     Document Type: Article

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