MWP-fit: A program for multiple whole-profile fitting of diffraction peak profiles by ab initio theoretical functions

Journal of Applied Crystallography

Volumn 34, Issue 5, 2001, Pages 669-676

  Ribarik G ^a   Ungar T ^a   Gubicza, J ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; LEAD SULFIDE;

ANISOTROPY; ARTICLE; CALCULATION; COMPUTER PROGRAM; CRYSTAL; DENSITY; DIFFRACTION; FOURIER TRANSFORMATION; MEASUREMENT; STRUCTURE ANALYSIS;

EID: 0034789824     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801011451     Document Type: Article

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