The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3173-3175

  Ungar T ^a   Borbely A ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000364419     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117951     Document Type: Article

References (24)

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