SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 58, Issue 2, 2002, Pages 190-200

Whole powder pattern modelling

(2) Scardi, P a Leoni, M a

a UNIVERSITY OF TRENTO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

NICKEL;

ANALYTIC METHOD; ARTICLE; DEFORMITY; DIFFRACTION; GRAIN; MATHEMATICAL MODEL; POWDER; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036098960 PISSN: 01087673 EISSN: None Source Type: Journal
DOI: 10.1107/S0108767301021298 Document Type: Article

Times cited : (518)

References (70)

1
- 0006228045
- edited by J. P. Cline, J. Post & P. Scardi. Abstract 22-25.4.2001, NIST, Gaithersburg, MD, USA
- (2001) Proceedings of the 3rd Conference on Accuracy in Powder Diffraction
- Armstrong, N.¹ Cline, J.P.² Kalceff, W.³ Bonevich, J.⁴

2
- 4243301144
- (2000) Mater. Sci. Forum , pp. 347-349
- Bergmann, J.¹ Kleeberg, R.² Haase, A.³ Breidenstein, B.⁴

3
- 0006145046
- PhD thesis, Delft University of Technology, The Netherlands
- (1994)
- Van Berkum, J.G.M.¹

4
- 0035241134
- (2001) Philos. Mag. , vol.A81 , pp. 49-60
- Chatterjee, P.¹ Sen Gupta, S.P.²

5
- 0026852338
- (1992) J. Appl. Cryst. , vol.25 , pp. 109-120
- Cheary, R.W.¹ Coelho, A.A.²

6
- 0006185789
- NIST, Gaithersburg, MD, USA
- (2000) Certificate SRM 660a
- Cline, J.P.¹ Deslattes, R.D.² Staudenmann, J.-L.³ Kessler, E.G.⁴ Hudson, L.T.⁵ Henins, A.⁶ Cheary, R.W.⁷

7
- 0002690488
- edited by R. A. Young, Oxford University Press
- (1993) The Rietveld Method , pp. 132-166
- Delhez, R.¹ De Keijser, Th.H.² Langford, J.I.³ Louër, D.⁴ Mittemeijer, E.J.⁵ Sonneveld, E.J.⁶

8
- 0025486928
- (1990) Metall. Trans. , vol.A21 , pp. 2333-2339
- Fecht, H.J.¹ Hellstern, E.² Fu, Z.³ Johnson, W.L.⁴

9
- 0006227707
- Argonne National Laboratory. November 1996
- (1996)
- Garbow, B.S.¹ Hillstrom, K.E.² More, J.J.³

10
- 0001247090
- (1996) Acta Cryst. , vol.A52 , pp. 561-589
- Gilmore, C.J.¹

11
- 0016952995
- (1976) J. Appl. Phys. , vol.47 , pp. 2200-2205
- Granqvist, C.G.¹ Buhrman, R.A.²

12
- 84914027357
- (1988) J. Appl. Cryst. , vol.21 , pp. 47-53
- Groma, I.¹ Ungar, T.² Wilkens, M.³

13
- 0002958958
- edited by R. A. Young, Oxford University Press
- (1993) The Rietveld Method , pp. 61-101
- Hill, R.¹

14
- 0001015530
- (1999) J. Appl. Cryst. , vol.32 , pp. 624-633
- Howard, C.J.¹ Kisi, E.H.²

15
- 0001867267
- (1997) Mater. Sci. Eng. , vol.A237 , pp. 43-51
- Islamgaliev, R.K.¹ Chmelik, F.² Kuzel, R.³

16
- 0006196429
- edited by R. L. Snyder, J. Fiala & H.-J. Bunge, Oxford University Press
- (1999) Defect and Microstructure Analysis by Diffraction , pp. 556-559
- Järvinen, M.¹

17
- 0034474942
- (2000) J. Appl. Cryst. , vol.33 , pp. 1122-1127
- Kamminga, J.-D.¹ Delhez, R.²

18
- 0006144573
- New Delhi: Allied Publishers Ltd. ISBN 81-7023-881-1
- (1998) A New Fundamental Parameters Approach in Profile Analysis of Powder Data
- Kern, A.A.¹ Coelho, A.A.²

19
- 0032593448
- (1999) Nanostruct. Mater. , vol.12 , pp. 327-332
- Kiss, L.B.¹ Süderlund, J.² Nikhsson, G.A.³ Granqvist, C.G.⁴

20
- 0002593283
- (1988) J. Appl. Cryst. , vol.21 , pp. 59-66
- Klimanek, P.¹ Kužel R., Jr.²

21
- 0003392447
- New York: Wiley
- (1974) X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed.
- Klug, H.P.¹ Alexander, L.E.²

22
- 0032034090
- (1998) Philos. Mag. , vol.77 , pp. 621-640
- Krill, C.E.¹ Birringer, R.²

23
- 0020884638
- (1983) Phys. Met. Metall. , vol.55 , pp. 1-12
- Krivoglaz, M.A.¹ Martynenko, O.V.² Ryaboshapka, K.P.³

24
- 0002455450
- (1963) Fiz. Metall. , vol.15 , pp. 18-28
- Krivoglaz, M.A.¹ Ryaboshapka, K.P.²

25
- 0000627505
- (1989) J. Appl. Cryst. , vol.22 , pp. 299-307
- Kužel R., Jr.¹ Klimanek, P.²

26
- 3142765611
- (1987) Prog. Cryst. Growth Charact. , vol.14 , pp. 185-211
- Langford, J.I.¹

27
- 0001185752
- Accuracy in powder diffraction II
- edited by E. Prince & J. K. Stalick, Gaithersburg, MA: US Department of Commerce
- (1992) NIST Spec. Publ. , vol.846 , pp. 110-126
- Langford, J.I.¹

28
- 0001884442
- (1982) J. Appl. Cryst. , vol.15 , pp. 20-26
- Langford, J.I.¹ Louër, D.²

29
- 0642293650
- (1996) Rep. Prog. Phys. , vol.59 , pp. 131-234
- Langford, J.I.¹ Louër, D.²

30
- 0034496849
- (2000) J. Appl. Cryst. , vol.33 , pp. 964-974
- Langford, J.I.¹ Louër, D.² Scardi, P.³

31
- 0003891980
- Report LAUR ,Los Alamos National Laboratory, NM, USA
- (1994) General Structure Analysis System (GSAS) , pp. 86-748
- Larson, A.C.¹ Von Dreele, R.B.²

32
- 0006143742
- edited by P. Scardi & E. J. Mittemejier, University of Trento, Italy. ISBN 88-8443-014-3
- (2001) Proceedings of Size-Strain III , pp. 31-32
- Leoni, M.¹ Scardi, P.²

33
- 0032262294
- (1998) Powder Diffr. , vol.13 , pp. 210-215
- Leoni, M.¹ Scardi, P.² Langford, J.I.³

34
- 0028481910
- (1994) J. Phys. Condens. Matter. , vol.6
- Liu, X.D.¹ Zhang, H.Y.² Lu, K.³ Hu, Z.Q.⁴

35
- 0003632783
- Handbook of applicable mathematics
- Chichester: Wiley
- (1984) Statistics , vol.4
- Lloyd, E.¹

36
- 0034856281
- (2001) J. Appl. Cryst. , vol.34 , pp. 409-426
- Madsen, I.C.¹ Scarlett, N.V.Y.² Cranswick, L.M.D.³ Lwin, T.⁴

37
- 0030108881
- (1996) Scr. Mater. , vol.34 , pp. 729-734
- Nazarov, A.A.¹ Romanov, A.E.² Valiev, R.Z.³

38
- 0000164695
- (1995) J. Appl. Cryst. , vol.28 , pp. 274-278
- Nunes, A.C.¹ Lin, D.²

39
- 0003781076
- reprint edition. Oxford University Press
- (1987) Physical Properties of Crystals: their Representation by Tensors and Matrices
- Nye, J.F.¹

40
- 0001362247
- (1981) J. Appl. Cryst. , vol.14 , pp. 357-361
- Pawley, G.S.¹

41
- 0026932245
- (1992) J. Appl. Cryst. , vol.25 , pp. 611-616
- Popa, N.C.¹

42
- 0000953036
- (1998) J. Appl. Cryst. , vol.31 , pp. 176-180
- Popa, N.C.¹

43
- 0034477413
- (2000) J. Appl. Cryst. , vol.33 , pp. 103-107
- Popa, N.C.¹

44
- 0002211129
- (1969) J. Appl. Cryst. , vol.2 , pp. 65-71
- Rietveld, H.M.¹

45
- 0001436893
- (1999) Mater. Sci. Eng. , vol.A271 , pp. 196-205
- Salimon, A.I.¹ Korsunky, A.M.² Ivanov, A.N.³

46
- 0029488938
- (1995) Mater. Sci. Eng. , vol.A204 , pp. 7-11
- Sanders, P.G.¹ Witney, A.B.² Weertman, J.R.³ Valiev, R.Z.⁴ Siegel, R.W.⁵

47
- 0000583210
- (1999) J. Appl. Cryst. , vol.32 , pp. 671-682
- Scardi, P.¹ Leoni, M.²

48
- 0034851821
- (2001) Acta Cryst. , vol.A57 , pp. 604-613
- Scardi, P.¹ Leoni, M.²

49
- 0001316953
- (2000) Eur. Phys. J. , vol.B18 , pp. 23-30
- Scardi, P.¹ Leoni, M.² Dong, Y.H.³

50
- 3543083206
- (2001) Mater. Sci. Forum , vol.378-381 , pp. 132-139
- Scardi, P.¹ Leoni, M.² Dong, Y.H.³

51
- 0002131413
- (2001) CPD Newsletter , vol.24 , pp. 23-24
- Scardi, P.¹ Leoni, M.² Dong, Y.H.³

52
- 0004086684
- Oxford University Press
- (1999) Defect and Microstructure Analysis by Diffraction
- Snyder, R.L.¹ Fiala, J.² Bunge, H.-J.³

53
- 0001436539
- (1999) J. Appl. Cryst. , vol.32 , pp. 281-289
- Stephens, P.W.¹

54
- 84959593523
- (1944) Proc. Cambridge Phys. Soc. , vol.40 , pp. 197-198
- Stokes, A.R.¹ Wilson, A.J.C.²

55
- 0032647952
- (1999) Acta Mater. , vol.47 , pp. 1255-1261
- Tian, H.H.¹ Atzmon, M.²

56
- 0002659631
- edited by R. A. Young, Oxford University Press
- (1993) The Rietveld Method , pp. 254-275
- Toraya, H.¹

57
- 0000276471
- (1999) J. Appl. Cryst. , vol.32 , pp. 992-999
- Ungár, T.¹ Dragomir, I.² Révész, Á.³ Borbély, A.⁴

58
- 0034993318
- (2001) J. Appl. Cryst. , vol.34 , pp. 298-310
- Ungár, T.¹ Gubicza, J.² Ribárik, G.³ Borbély, A.⁴

59
- 0033900777
- (2000) Prog. Mater. Sci. , vol.45 , pp. 103-189
- Valiev, R.Z.¹ Islamgaliev, R.K.² Alexandrov, I.V.³

60
- 0028467532
- (1994) Acta Metall. Mater. , vol.42 , pp. 2467-2474
- Valiev, R.Z.¹ Kozlov, E.V.² Ivanov, Y.F.³ Lian, J.⁴ Nazarov, A.A.⁵ Baudelet, B.⁶

61
- 0034480317
- (2000) J. Appl. Cryst. , vol.33 , pp. 296-306
- Velterop, L.¹ Delhez, R.² De Keijser, Th.H.³ Mittemeijer, E.J.⁴ Reefman, D.⁵

62
- 0003472812
- Reading, MA: AddisonWesley
- (1969) X-ray Diffraction
- Warren, B.E.¹

63
- 0014803629
- (1970) Phys. Status Solidi A , vol.2 , pp. 359-370
- Wilkens, M.¹

64
- 0000041764
- edited by J. A. Simmons, R. de Wit & R. Bullough, Natl Bur. Stand. (US) Spec. Publ. No. 317. Washington, DC: NBS
- (1970) Fundamental Aspects of Dislocation Theory , vol.2 , pp. 1195-1221
- Wilkens, M.¹

65
- 84990723297
- (1987) Phys. Status Solidi A , vol.104
- Wilkens, M.¹

66
- 0003540728
- London: Methuen.
- (1962) X-ray Optics, 2nd ed.
- Wilson, A.J.C.¹

67
- 0000182838
- (1998) J. Appl. Cryst. , vol.31 , pp. 356-362
- Wu, E.¹ Mac, E.² Gray, A.³ Kisi, E.H.⁴

68
- 0001348913
- (1999) Adv. X-ray Anal. , vol.41 , pp. 544-555
- York, B.R.¹

69
- 0004326059
- Oxford University Press
- (1993) The Rietveld Method
- Young, R.A.¹

70
- 0342468731
- (2001) Acta Mater. , vol.49 , pp. 365-375
- Zhao, Y.H.¹ Sheng, H.W.² Lu, K.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.