Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis

Acta Materialia

Volumn 46, Issue 10, 1998, Pages 3693-3699

  Ungar T ^a   Ott, S ^a   Sanders, P G ^b   Borbely A ^a   Weertman, J R ^b  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (SPECIFIC GRAVITY); DISLOCATIONS (CRYSTALS); NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; TWINNING; X RAY CRYSTALLOGRAPHY;

PEAK PROFILE ANALYSIS; WARREN-AVERBACH PLOT; WILLIAMSON-HALL PLOT;

COPPER;

EID: 0032084106     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00001-9     Document Type: Article

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