Vacancy production during plastic deformation in copper determined by in situ X-ray diffraction

Materials Science and Engineering: A

Volumn 462, Issue 1-2, 2007, Pages 398-401

  Ungár, Tamás ^a   Schafler, Erhard ^b   Hanák, Péter ^a   Bernstorff, Sigrid ^c   Zehetbauer, Michael ^b  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^b UNIVERSITY OF VIENNA   (Austria)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

Diffuse X ray scattering; Plastic deformation; Vacancies; X ray line profile analysis

Indexed keywords

ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; VACANCIES; X RAY DIFFRACTION;

DIFFUSE X-RAY SCATTERING; X-RAY LINE PROFILE ANALYSIS;

COPPER;

COPPER; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; VACANCIES; X RAY DIFFRACTION;

EID: 34247512428     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2006.03.156     Document Type: Article

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