A second-order phase-transformation of the dislocation structure during plastic deformation determined by in situ synchrotron X-ray diffraction

Acta Materialia

Volumn 53, Issue 2, 2005, Pages 315-322

  Schafler, E ^a,c   Simon, K ^b   Bernstorff, S ^d   Hanak P ^b   Tichy, G ^b   Ungar T ^b   Zehetbauer, M J ^a  

^a UNIVERSITY OF VIENNA   (Austria)

^b EÖTVÖS LORÁND UNIVERSITY   (Hungary)

^c ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^d Sincrotrone Trieste ^*  (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; IN SITU PROCESSING; LOW TEMPERATURE EFFECTS; MICROSTRUCTURE; PHASE TRANSITIONS; PLASTIC DEFORMATION; SINGLE CRYSTALS; STRAIN; STRESS ANALYSIS; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

DISLOCATION DENSITY; DISLOCATION STRUCTURES; MICROSCOPIC DISLOCATION MODEL; TAYLOR MODEL;

COPPER;

EID: 10044290987     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.09.025     Document Type: Article

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