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Journal of Applied Crystallography

Volumn 33, Issue 3 II, 2000, Pages 964-974

Effect of a crystallite size distribution on X-ray diffraction line profiles and whole-powder-pattern fitting

(3) Langford, J I a Louer D a Scardi, P a

a UNIVERSITY OF BIRMINGHAM (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; DATA ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

EID: 0034496849 PISSN: 00218898 EISSN: None Source Type: Journal
DOI: 10.1107/S002188980000460X Document Type: Article

Times cited : (318)

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