Estimating grain-size distributions in nanocrystalline materials from X-ray diffraction profile analysis

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 77, Issue 3, 1998, Pages 621-640

  Krill, C E ^a   Birringer, R ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032034090     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619808224072     Document Type: Article

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