Fourier modelling of the anisotropic line broadening of X-ray diffraction profiles due to line and plane lattice defects

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 671-682

  Scardi, Paolo ^a   Leoni, Matteo ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000583210     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188989900374X     Document Type: Article

References (9)

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9. Young, R. A. (1993). Editor. The Rietveld Method. Oxford University Press.