Ambiguity in the magnitude and direction of the derived interface dipole in lanthanum aluminate heterostructures: Implications and proposed solution

Journal of Applied Physics

Volumn 109, Issue 9, 2011, Pages

  Liu, Z Q ^a   Chim, W K ^a   Chiam, S Y ^b   Pan, J S ^b   Ng, C M ^c  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^c GLOBALFOUNDRIES SINGAPORE PTE LTD   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE MEASUREMENT; BAND ALIGNMENTS; DIFFERENTIAL CHARGING; ELECTRIC FIELD STRENGTH; INTERFACE DIPOLE; LANTHANUM ALUMINATE; LEVEL MODEL; PHOTOEMISSION TECHNIQUES; SURFACE CONTAMINANTS; VALENCE BAND OFFSETS;

CRYSTALS; ELECTRIC FIELDS; ELECTRIC PROPERTIES; ELECTRON AFFINITY; ELECTRONIC PROPERTIES; LANTHANUM; LANTHANUM ALLOYS;

HETEROJUNCTIONS;

EID: 79959505984     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3579423     Document Type: Article

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