Band offsets of ultrathin high- κ oxide films with Si

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 8, 2008, Pages

  Bersch, Eric ^a   Rangan, Sylvie ^a   Bartynski, Robert Allen ^a   Garfunkel, Eric ^a   Vescovo, Elio ^b  

^a RUTGERS UNIVERSITY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49649120615     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.085114     Document Type: Article

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