Effect of surface oxidation on the nm-scale wear behavior of a metallic glass

Journal of Applied Physics

Volumn 109, Issue 8, 2011, Pages

  Caron, A ^a   Sharma, P ^a   Shluger, A ^a,b   Fecht, H J ^a,c,d   Louzguine Luzguin, D V ^a   Inoue, A ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF ULM   (Germany)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FRICTION BEHAVIOR; MECHANICAL COMPONENTS; MICROMECHANICAL SYSTEMS; NATIVE OXIDE LAYER; POWER LAW; SIZE REDUCTIONS; SUBMICROMETERS; SURFACE OXIDATIONS; SURFACE OXIDE LAYER; WEAR BEHAVIORS; WEAR RATES;

ANNEALING; ATOMIC FORCE MICROSCOPY; GLASS; METALLIC COMPOUNDS; NIOBIUM; WEAR OF MATERIALS;

METALLIC GLASS;

EID: 79955738736     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3573778     Document Type: Article

References (67)

1. Wear: Materials, Mechanisms and Practice, edited by, G.W. Stachowiak, (Wiley, Chichester, UK, 2006).
2. A. Morina and A. Neville, J. Phys. D 40, 5476 (2007); 10.1088/0022-3727/40/18/508
3. P. Kar, P. Asthana, and H. Liang, J. Tribol 130, 042301 (2008). 10.1115/1.2958071
4. F. H. Stott, D. S. Lin, and G. C. Wood, Corros. Sci. 13, 449 (1973). 10.1016/0010-938X(73)90030-9
5. I. A. Inman, S. Datta, H. L. Du, J. S. Burnell-Gray, and Q. Luo, Wear 254, 461 (2003).
6. C. H. Hager, Jr., J. Hu, C. Muratore, A. A. Voevodin, and R. Grandhi, Wear 268, 1195 (2010). 10.1016/j.wear.2009.11.004
7. J. W. Gardner, V. K. Varadan, and O. O. Awadelkarim, Microsensors, MEMS and Smart Devices (Wiley, Chichester, UK, 2001).
8. Y. Shimizu, D. Watanabe, E. Fukushima, K. Kita, H. Taked, M. Ishida, N. Nishiyama, Y. Saotome, and A. Inoue, JSME Symp. Mot. Power Transmissions 2004, 88 (2004).
9. M. Mehregany, K. J. Gabriel, and W. S. N. Trimmer, IEEE Trans. Electron. Devices 35 (6), 719 (1988). 10.1109/16.2522 (Pubitemid 18639627)
10. R. W. Wood, J. Miles, and T. Olson, IEEE Trans. Magn. 38, 1711 (2002). 10.1109/TMAG.2002.1017761 (Pubitemid 34813681)
11. N. Nishiyama, K. Takenaka, N. Togashi, H. Miura, N. Saidoh, and Akihisa Inoue, Intermetallics 18, 1983 (2010). 10.1016/j.intermet.2010.02.027
12. R. A. Singh and E.-S. Yoon, Wear 263, 912 (2007). 10.1016/j.wear.2007.01. 059 (Pubitemid 47284280)
13. R. Bandorf, H. Luethje, K. Schiffmann, T. Staedler, and A. Wortmann, Microsyst. Technol. 8, 51 (2002). 10.1007/s00542-001-0155-5 (Pubitemid 34555017)
14. P. Ayala, M. E. H. Maia de Costa, R. Prioli, F. L. Freire, Jr., Surf. Coat. Technol. 182, 335 (2004). 10.1016/j.surfcoat.2003.08.075 (Pubitemid 38537248)
15. R. A. Singh, E.-S. Yoon, H.-G. Han, and H. Kong, Wear 262, 130 (2007). 10.1016/j.wear.2006.04.001 (Pubitemid 44750078)
16. W. Zhao, M. Zhu, Y. Mo, and M. Bai, Colloids Surf., A 332, 78 (2009). 10.1016/j.colsurfa.2008.09.025
17. Z. Tao and B. Bhushan, Tribol. Lett. 21 (1), 1 (2006). 10.1007/s11249-005-9001-8 (Pubitemid 43372602)
18. A. R. Kraus, O. Auciello, D. M. Gruen, A. Jayatissa, A. Sumant, J. Tucek, D. C. Mancini, N. Moldovan, A. Erdemir, D. Ersoy, M. N. Gardos, H. G. Busmann, E. M. Meyer, and M. Q. Ding, Diam. Relat. Mater. 10, 1952 (2001). 10.1016/S0925-9635(01)00385-5 (Pubitemid 33045071)
19. S. Sundararajan and B. Bhushan, Wear 217, 251 (1998). 10.1016/S0043-1648(98)00169-0 (Pubitemid 28437983)
20. S. A. Smallwood, K. C. Eapen, S. T. Patton, and J. S. Zabinski, Wear 260, 1179 (2006). 10.1016/j.wear.2005.07.019
21. S. S. Mani, J. G. Fleming, J. A. Walraven, J. J. Sniegowski, M. P. se Beer, L. W. Irwin, D. M. Tanner, D. A. LaVan, M. T. Dugger, J. Jakubczak, and W. M. Miller, IEEE 38th Ann. Int. Reliab. Phys. Symp. (2000) pp. 146-151.
22. T. M. Mayer, J. W. Elam, S. M. George, P. G. Kotula, and R. S. Goeke, Appl. Phys. Lett. 82, 2883 (2003). 10.1063/1.1570926
23. C. Nistorica, J.-F. Liu, I. Gory, D. Skidmore, F. M. Mantiziba, E. Gnade, and J. Kim, J. Vac. Sci. Technol. A 23, 836 (2005). 10.1116/1.1885022 (Pubitemid 43119213)
24. W. R. Ashurst, Y. J. Jang, L. Magagnin, C. Carraro, M. M. Sung, and R. Maboudian, 17th IEEE Int. Conf. MEMS, (2004).
25. S. Venkatesan and B. Bhushan, Wear 171, 25 (1994). 10.1016/0043-1648(94) 90344-1
26. B. Bhushan, Microelectron. Eng. 84, 387 (2007). 10.1016/j.mee.2006.10.059 (Pubitemid 46241517)
27. S. T. Patton, W. D. Cowan, K. C. Eapen, and J. S. Zabinski, Tribol. Lett. 9 (3-4), 199 (2000). 10.1023/A:1018817123441
28. Y. Saotome, K. Itoh, T. Zhang, and A. Inoue, Scr. Mater. 44, 1541 (2001). 10.1016/S1359-6462(01)00837-5 (Pubitemid 32549225)
29. P. Sharma, N. Kaushik, H. Kimura, Y. Saotome, and A. Inoue, Nanotechnology 18, 035302 (2007). 10.1088/0957-4484/18/3/035302 (Pubitemid 46212110)
30. J. Schroers, Adv. Mater. 22, 1566 (2010).
31. A. Inoue and N. Nishiyama, MRS Bull. 32 (8), 651 (2007). 10.1557/mrs2007.128
32. A. Inoue, Acta Mater. 48, 279 (2000). 10.1016/S1359-6454(99)00300-6 (Pubitemid 30558408)
33. H. J. Fecht and W. L. Johnson, Nature 334, 50 (1988). 10.1038/334050a0 (Pubitemid 18646873)
34. W. H. Wang, C. Dong, and C. H. Shek, Mater. Sci. Eng. R 44, 45 (2004). 10.1016/j.mser.2004.03.001
35. M. M. Trexler and N. N. Thadhani, Prog. Mater. Sci. 55, 759 (2010). 10.1016/j.pmatsci.2010.04.002
36. A. R. Yavari, J. J. Lewandowski, and J. Eckert, MRS Bull. 32 (8), 635 (2007). 10.1557/mrs2007.125
37. D. V. Louzguine-Luzgin, A. R. Yavari, G. Xie, S. Madge, S. Li, J. Saida, A. L. Greer, and A. Inoue, Philo. Mag. Lett. 90 (2), 139 (2010). 10.1080/09500830903485544
38. E. Fleury, S. M. Lee, H. S. Ahn, W. T. Kim, and D. H. Kim, Mater. Sci. Eng., A 276, 375-377 (2004). 10.1016/j.msea.2003.10.065 (Pubitemid 38927066)
39. Y. Yokoyama, K. Yamano, K. Fukaura, H. Sunada, and A. Inoue, Mater. Trans. 40, 1015 (1999).
40. M. Z. Ma, R. P. Liu, Y. Xiao, D. C. Lou, L. Liu, Q. Wang, and W. K. Wang, Mater. Sci. Eng., A 386, 326 (2004). 10.1016/j.msea.2004.07.054 (Pubitemid 39393724)
41. J. Kong, D. Xiong, J. Li, Q. Yuan, R. Tyagi, Tribol. Lett. 35, 151 (2009). 10.1007/s11249-009-9444-4
42. L. F. Liu, H. A. Zhang, and C. Shi, Tribol. Lett. 33, 205 (2009). 10.1007/s11249-009-9410-1
43. N. Togashi, M. Ishida, N. Nishiyama, and A. Inoue, Rev. Adv. Mater. Sci. 18, 93 (2008).
44. C. Suryanarayana and A. Inoue, Bulk Metallic Glasses (CRC, Boca Raton, FL, 2011).
45. Y. Li, S. J. Poon, G. J. Shiflet, J. Xu, D. H. Kim, and J. F. Loeffler, MRS Bull. 32 (8), 624 (2007). 10.1557/mrs2007.123
46. J. F. Loeffler, Intermetallics 11, 529 (2003). 10.1016/S0966-9795(03) 00046-3
47. Triwikantoro, D. Toma, M. Meuris, and U. Koester, J. Non-Cryst. Solids 719, 250-252 (1999). 10.1016/50022-3093(99)00167-2
48. A. Caron, C. L. Qin, L. Gu, S. Gonzlez, A. Shluger, H.-J. Fecht, D. V. Louzguine-Luzgin, and A. Inoue, Nanotechnology 22, 095704 (2011). 10.1088/0957-4484/22/9/095704
49. R. Bennewitz, Friction Force Microscopy. in Fundamentals of Friction and Wear on the Nanoscale, edited by., E. Gnecco, and, E. Meyer, (Springer, New York, 2007) pp. 1-14.
50. K. Brhne, K. V. Kumar, H.-J. Fecht, P. Gluche, and A. Floter, Rev. Adv. Mater. Sci. 10 (3), 224 (2005).
51. J. K. Luo, Y. Q. Fu, H. R. Le, J. A. Williams, S. M. Spearing, and W. I Milne, J. Micromech. Microeng. 17, S147 (2007). 10.1088/0960-1317/17/7/S12 (Pubitemid 47192975)
52. B. Bhushan and O. Marti, Scanning Probe Microscopy-Principle of Operation, Instrumentation, and Probes. in Nanotribology and Nanomechanics: An Introduction, edited by, B. Bhushan, (Springer, New York, 2008) pp. 37-110.
53. Nioprobe AFM tip apex imaging device manufactured by Nanoscience Instruments, Phoenix AZ, USA. http://www.nanoscience.com
54. See www.gwyddion.net for information on gwyddion software.
55. C. A. Volkert, A. Donohue, and F. Spaepen, J. Appl. Phys. 103, 083539 (2008). 10.1063/1.2884584 (Pubitemid 351623560)
56. A. R. Yavari, K. Georgarakis, W. J. Botta, A. Inoue, and G. Vaughan, Phys. Rev. B 82, 172202 (2010). 10.1103/PhysRevB.82.172202
57. D. Jang and J. R. Greer, Nature Materials 9, 215 (2010).
58. C. A. Schuh and T. G. Nieh, Acta Mater. 51, 87 (2003). 10.1016/S1359-6454(02)00303-8
59. B. Bhushan, V. N. Koinkar, and J. Ruan, J. Eng. Tribol. 208, 17 (1994);
60. B. Bhushan, Nanotribology, Nanomechanics and Materials Characterization. in Nanotribology and Nanomechanics: An Introduction, edited by, B. Bhushan, (Springer, New York, 2008) pp. 311-416.
61. B. Bhushan and K. J. Kwak, J. Phys. Condens. Matter 20, 325240 (2008). 10.1088/0953-8984/20/32/325240
62. N. S. Tambe and B. Bhushan, Nanotechnology 16, 2309 (2005). 10.1088/0957-4484/16/10/054 (Pubitemid 41376173)
63. B. Bhushan and K. J. Kwak, Nanotechnology 18, 345504 (2007);
64. B. Bhushan and K. J. Kwak, Appl. Phys. Lett. 91, 163113 (2007).
65. Z. Tao and B. Bhushan, J. Vac. Sci. Technol. A 25, 1267 (2007). 10.1116/1.2435381 (Pubitemid 47142975)
66. S. C. Lim and M. F. Ashby, Acta Metall. 35, 1 (1987). 10.1016/0001-6160(87)90209-4 (Pubitemid 17479650)
67. D.-I. Kim, K.-H. Kim, and H.-S. Ahn, Int. J. Precis. Eng. Manuf. 11 (5), 741 (2010). 10.1007/s12541-010-0087-z