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Volumn , Issue , 2008, Pages 37-110

Scanning probe microscopy - Principle of operation, instrumentation, and probes

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EID: 79751494822     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-3-540-77608-6_2     Document Type: Chapter
Times cited : (5)

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