Friction behaviour of chemical vapor deposited self-assembled monolayers on silicon wafer

Wear

Volumn 262, Issue 1-2, 2007, Pages 130-137

  Arvind Singh, R ^a   Yoon, Eui Sung ^a   Han, Hung Gu ^a   Kong, Hosung ^a  

^a Korea Institute of Science and Technology   (South Korea)

Author keywords

AFM; Friction; Micro; Nano; SAM; Tribology; Wear

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; SELF ASSEMBLY; SILICON WAFERS; TRIBOLOGY;

GLASS BALLS; MICRO SCALE FRICTION; SOLID SOLID ADHESION;

FRICTION;

ADHESION; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; FRICTION; SELF ASSEMBLY; SILICON WAFERS; TRIBOLOGY;

EID: 33750975879     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2006.04.001     Document Type: Article

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