Platinum-coated probes sliding at up to 100 mm s-1 against coated silicon wafers for AFM probe-based recording technology

Nanotechnology

Volumn 18, Issue 34, 2007, Pages

  Bhushan, Bharat ^a   Kwak, Kwang Joo ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENIDES; COATINGS; DATA STORAGE EQUIPMENT; DIAMOND LIKE CARBON FILMS; PLATINUM COMPOUNDS; PROBES;

FILM SURFACES; LUBRICANT COATED DLC FILM SURFACES; WEAR MECHANISM;

SILICON WAFERS;

CHALCOGEN; LUBRICATING AGENT; PLATINUM; SILICON;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL REACTION; COMPUTER PROGRAM; ELECTRIC CONDUCTIVITY; HEAT; MECHANICAL PROBE; NANOTECHNOLOGY; PRIORITY JOURNAL; RECORDING; SENSITIVITY ANALYSIS; SURFACE PROPERTY; TEMPERATURE; VELOCITY;

EID: 34547796896     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/34/345504     Document Type: Article

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