-
5
-
-
0030364402
-
-
N. Tas, T. Sonnenberg, H. Jansen, R. Legtenbergh and M. Elwenspeoek, J. Micromech. Microeng. 6 (1996) 385.
-
(1996)
J. Micromech. Microeng.
, vol.6
, pp. 385
-
-
Tas, N.1
Sonnenberg, T.2
Jansen, H.3
Legtenbergh, R.4
Elwenspeoek, M.5
-
11
-
-
0025604021
-
-
Napa Valley, CA
-
M.G. Lim, J.C. Chang, D.P. Schultz, R.T. Howe and R.M. White, in: Proc. of the 3rd IEEE Workshop on Micro Electro Mechanical Systems, Napa Valley, CA (1990) p. 82.
-
(1990)
Proc. of the 3rd IEEE Workshop on Micro Electro Mechanical Systems
, pp. 82
-
-
Lim, M.G.1
Chang, J.C.2
Schultz, D.P.3
Howe, R.T.4
White, R.M.5
-
14
-
-
0041626649
-
-
ed. B. Bhushan Kluwer, Dordrecht, ch. 7
-
U. Srinivasan, R.T. Howe and R. Maboudian, in: Tribology Issues and Opportunities in MEMS, ed. B. Bhushan (Kluwer, Dordrecht, 1998) ch. 7.
-
(1998)
Tribology Issues and Opportunities in MEMS
-
-
Srinivasan, U.1
Howe, R.T.2
Maboudian, R.3
-
15
-
-
0002528131
-
-
Hilton Head, SC
-
U. Srinivasan, J.D. Foster, U. Habib, R.T. Howe, R. Maboudian, D.C. Senft and M.T. Dugger, in: Proc. IEEE Solid - State Sensor and Actuator Workshop, Hilton Head, SC (1998) p. 156.
-
(1998)
Proc. IEEE Solid - State Sensor and Actuator Workshop
, pp. 156
-
-
Srinivasan, U.1
Foster, J.D.2
Habib, U.3
Howe, R.T.4
Maboudian, R.5
Senft, D.C.6
Dugger, M.T.7
-
17
-
-
0344239354
-
-
D.M. Tanner, N.F. Smith, D.J. Bowman, W.P. Eaton and K.A. Peterson, Proc. SPIE 3224 (1997) 14.
-
(1997)
Proc. SPIE
, vol.3224
, pp. 14
-
-
Tanner, D.M.1
Smith, N.F.2
Bowman, D.J.3
Eaton, W.P.4
Peterson, K.A.5
-
18
-
-
0002076487
-
-
S.L. Miller, G.F. LaVigne, M.S. Rodgers, J.J. Sniegowski, J.P. Waters and P.J. McWhorter, Proc. SPIE 3224 (1997) 24.
-
(1997)
Proc. SPIE
, vol.3224
, pp. 24
-
-
Miller, S.L.1
LaVigne, G.F.2
Rodgers, M.S.3
Sniegowski, J.J.4
Waters, J.P.5
McWhorter, P.J.6
-
20
-
-
0032293023
-
-
D.M. Tanner, K.A. Peterson, L.W. Irwin, P. Tangyunyong, W.M. Miller, W.P. Eaton, N.F. Smith and M.S. Rodgers, Proc. SPIE 3512 (1998) 215.
-
(1998)
Proc. SPIE
, vol.3512
, pp. 215
-
-
Tanner, D.M.1
Peterson, K.A.2
Irwin, L.W.3
Tangyunyong, P.4
Miller, W.M.5
Eaton, W.P.6
Smith, N.F.7
Rodgers, M.S.8
-
23
-
-
0032670035
-
-
San Diego, CA
-
D.M. Tanner, J.A. Walraven, L.W. Irwin, M.T. Dugger, N.F. Smith, W.P. Eaton, W.M. Miller and S.L. Miller, in: IEEE Int. Reliability Physics Symp., San Diego, CA (1999) p. 189.
-
(1999)
IEEE Int. Reliability Physics Symp.
, pp. 189
-
-
Tanner, D.M.1
Walraven, J.A.2
Irwin, L.W.3
Dugger, M.T.4
Smith, N.F.5
Eaton, W.P.6
Miller, W.M.7
Miller, S.L.8
-
28
-
-
0043129435
-
-
Munich, Germany
-
M.P. de Boer, J.A. Knapp, T.M. Mayer and T.A. Michalske, in: SPIE/EOS Conf. on Microsystems Metrology and Inspection, Munich, Germany (1999).
-
(1999)
SPIE/EOS Conf. on Microsystems Metrology and Inspection
-
-
De Boer, M.P.1
Knapp, J.A.2
Mayer, T.M.3
Michalske, T.A.4
-
29
-
-
0026986369
-
-
Hilton Head, SC
-
R.L. Alley, G.J. Cuan, R.T. Howe and K. Komovopoulos, in: Proc. IEEE Solid - State Sensor and Actuator Workshop, Hilton Head, SC (1992) p. 202.
-
(1992)
Proc. IEEE Solid - State Sensor and Actuator Workshop
, pp. 202
-
-
Alley, R.L.1
Cuan, G.J.2
Howe, R.T.3
Komovopoulos, K.4
-
31
-
-
33751154555
-
-
R. Banga, J. Yarwood, A.M. Morgan, B. Evans and J. Kells, Langmuir 11 (1995) 4393.
-
(1995)
Langmuir
, vol.11
, pp. 4393
-
-
Banga, R.1
Yarwood, J.2
Morgan, A.M.3
Evans, B.4
Kells, J.5
-
34
-
-
0019572667
-
-
R.G. Bayer, Wear 69 (1981) 235.
-
(1981)
Wear
, vol.69
, pp. 235
-
-
Bayer, R.G.1
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