The role of lubricants, scanning velocity and operating environment in adhesion, friction and wear of Pt-Ir coated probes for atomic force microscope probe-based ferroelectric recording technology

Journal of Physics Condensed Matter

Volumn 20, Issue 32, 2008, Pages

  Bhushan, Bharat ^a   Kwak, Kwang Joo ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC PHYSICS; ATOMS; DATA RECORDING; FERROELECTRIC DEVICES; FERROELECTRICITY; FRICTION; IRIDIUM; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PLATINUM; SCANNING; SEMICONDUCTING LEAD COMPOUNDS; TECHNOLOGY;

ALTERNATIVE TECHNOLOGIES; AREAL DENSITIES; ATOMIC FORCE MICROSCOPE; COATED PROBES; COATED TIPS; CONDUCTIVE ATOMIC FORCE MICROSCOPE; FERROELECTRIC DATA STORAGE; FRICTION AND WEAR; HIGH DATA RATE; LEAD ZIRCONATE-TITANATE; OPERATING ENVIRONMENT; PROBE-BASED; PZT FILMS; SCANNING VELOCITIES;

FERROELECTRIC MATERIALS;

EID: 49149106204     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/32/325240     Document Type: Article

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