Structure, ferroelectric/magnetoelectric properties and leakage current density of (Bi0.85Nd0.15)FeO3 thin films

Journal of Alloys and Compounds

Volumn 509, Issue 17, 2011, Pages 5326-5335

  Simoes A Z ^a   Cavalcante, L S ^a   Moura, F ^b   Longo, E ^a   Varela, J A ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b FEDERAL UNIVERSITY OF ITAJUBÁ   (Brazil)

Author keywords

Chemical synthesis; Ferroelectrics; Magnetic measurements; Piezoelectricity

Indexed keywords

ATOMIC FORCE; CHEMICAL SYNTHESIS; CLUSTER MODELS; DOMAIN PATTERN; DOMAIN SWITCHINGS; DOMINANT MECHANISM; FERROELECTRICS; FIELD EMISSION SCANNING; LONGITUDINAL DIRECTION; LOW-LEAKAGE CURRENT; MAGNETIC MEASUREMENTS; MAGNETOELECTRIC COEFFICIENTS; MAGNETOELECTRIC COUPLINGS; MAGNETOELECTRIC PROPERTIES; MATRIX; NANO DOMAIN; PIEZOELECTRIC FORCE MICROSCOPY; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION REVERSALS; POLYMERIC PRECURSOR METHODS; PT(111); RHOMBOHEDRAL PHASE; SI SUBSTRATES; SPACE-CHARGE-LIMITED; STATIC AIR; STRAIN BEHAVIORS; TETRAGONAL STRUCTURE; X-RAY PATTERNS;

BISMUTH; CURRENT DENSITY; FERROELECTRIC MATERIALS; FIELD EMISSION; HYSTERESIS; HYSTERESIS LOOPS; IRON OXIDES; MAGNETIC DOMAINS; MAGNETIC MATERIALS; MAGNETIC VARIABLES MEASUREMENT; NEODYMIUM; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; PLATINUM; POLARIZATION; RIETVELD METHOD; RIETVELD REFINEMENT; SYNTHESIS (CHEMICAL); THIN FILMS;

LEAKAGE CURRENTS;

EID: 79953192131     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2011.02.030     Document Type: Article

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