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Journal of Applied Physics

Volumn 107, Issue 12, 2010, Pages

Influence of Zr doping on the structure and ferroelectric properties of BiFeO3 thin films

(5) Mukherjee, Somdutta a Gupta, Rajeev a Garg, Ashish a Bansal, Vipul b Bhargava, Suresh b

a INDIAN INSTITUTE OF TECHNOLOGY KANPUR (India)

b RMIT UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BOND STRENGTH; CHEMICAL SOLUTION DEPOSITION; COERCIVE FIELD; DIELECTRIC MEASUREMENTS; FERROELECTRIC MEASUREMENTS; FERROELECTRIC PROPERTY; LATTICE DISTORTIONS; LOW-FREQUENCY RELAXATION; PHASE FORMATIONS; REMNANT POLARIZATIONS; STRUCTURAL CHARACTERIZATION; ZR-DOPING;

DOPING (ADDITIVES); FERROELECTRICITY; GRAIN BOUNDARIES; RAMAN SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION; ZIRCONIUM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77954202704 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3436593 Document Type: Article

Times cited : (88)

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