Study on the ferroelectricity of Eu substituted BiFeO3 films

Solid State Communications

Volumn 149, Issue 43-44, 2009, Pages 1958-1961

  Liu, Hongri ^a   Liu, Tangkun ^a   Wang, Xiuzhang ^a  

^a HUBEI NORMAL UNIVERSITY   (China)

Author keywords

A. Ferroelectrics; B. Sol gel processing; C. X ray scattering; D. Ferroelectricity

Indexed keywords

A. FERROELECTRICS; B. SOL-GEL PROCESSING; C. X-RAY SCATTERING; CHEMICAL SOLUTION DEPOSITION METHOD; D. FERROELECTRICITY; DIELECTRIC DISPERSION; REMNANT POLARIZATIONS; ROOM TEMPERATURE; SI SUBSTRATES; THICKNESS OF THE FILM;

CERAMIC CAPACITORS; DIELECTRIC LOSSES; DIFFRACTION; ELECTRIC FIELDS; EUROPIUM; FERROELECTRICITY; GELATION; GELS; HOLOGRAPHIC INTERFEROMETRY; HYSTERESIS; HYSTERESIS LOOPS; IRON OXIDES; SCATTERING; SEMICONDUCTING BISMUTH COMPOUNDS; SILICON COMPOUNDS; SOL-GEL PROCESS; SOL-GELS; SOLS; THIN FILMS; X RAY SCATTERING;

FERROELECTRIC FILMS;

EID: 70349389401     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2009.07.032     Document Type: Article

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