Enhancement of electrical properties in polycrystalline BiFe O3 thin films

Applied Physics Letters

Volumn 89, Issue 19, 2006, Pages

  Yun, Kwi Young ^a   Ricinschi, Dan ^a   Kanashima, Takeshi ^a   Okuyama, Masanori ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CURRENT DENSITY; ELECTRIC PROPERTIES; LEAKAGE CURRENTS; PEROVSKITE; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC POLARIZATION; LEAKAGE CURRENT DENSITY; PEROVSKITE SINGLE PHASEES; TETRAGONAL STRUCTURE;

THIN FILMS;

EID: 33750902070     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2385859     Document Type: Article

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